Quantitative compositional mapping of Bi segregation to grain boundaries in Cu

Authors: Keast V.J.; Williams D.B.

Source: Acta Materialia, Volume 47, Number 15, November 1999 , pp. 3999-4008(10)

Publisher: Elsevier

Keywords: Grain boundary embrittlement; Segregation; X-ray microanalysis

Language: English

Document Type: Research article

DOI: http://dx.doi.org/10.1016/S1359-6454(99)00260-8

Affiliations: 1: 2Department of Materials Science and Engineering, Whitaker Lab #5, Lehigh University, Bethlehem, USA

Publication date: 1999-11-01

• In this: publication
• By this: publisher
• In this Subject: Materials & Manufacturing ,  Mining & Metallurgy
• By this author: Keast V.J. ;  Williams D.B.

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