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Cracking phenomena in In0.25Ga0.75As films on InP substrates

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Keywords: Analytical electron microscopy; Compound semiconductors; Fracture

Document Type: Research Article

DOI: http://dx.doi.org/10.1016/S1359-6454(99)00211-6

Affiliations: Department of Materials Science and Engineering, McMaster University, Hamilton, Canada

Publication date: September 29, 1999

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