Electron microscopy of high-T_c Josephson junctions formed in the epitaxial layer ramp-edge geometry: YBCO/barrier/YBCO

Authors: Merkle K.L.; Huang Y.; Rozeveld S.; Char K.; Moeckly B.H.

Source: Micron, Volume 30, Number 5, October 1999 , pp. 539-559(21)

Publisher: Elsevier

Keywords: YBCO microstructures; Ramp-edge junctions; Metallic oxide barriers

Language: English

Document Type: Research article

DOI: http://dx.doi.org/10.1016/S0968-4328(99)00053-0

Affiliations: 1: aMaterials Science Division, Argonne National Laboratory, Argonne, IL, USA

Publication date: 1999-10-01

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• By this author: Merkle K.L. ;  Huang Y. ;  Rozeveld S. ;  Char K. ;  Moeckly B.H.

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