Design and testing of data-driven self-timed RSFQ shift register

Authors: John Deng Z.; Yoshikawa N.; Whiteley S.R.; Van Duzer T.

Source: Applied Superconductivity, Volume 6, Number 10, 11 October 1999 , pp. 585-589(5)

Publisher: Elsevier

Language: English

Document Type: Research article

DOI: http://dx.doi.org/10.1016/S0964-1807(99)00015-0

Affiliations: 1: Faculty of Engineering, Yokohama National University, 79-5 Tokiwadai, Hodogaya, Yokohama 240, Japan

Publication date: 1999-10-11

• In this: publication
• By this: publisher
• In this Subject: Electrical & Nuclear Engineering ,  Electricity & Magnetism
• By this author: John Deng Z. ;  Yoshikawa N. ;  Whiteley S.R. ;  Van Duzer T.

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