< previous issue
next issue >
Developments in the Use of RHEED for Interpreting Growth Processes in the MBE of Wide Gap II-VI Semiconductors
Griesche, J.; Hoffmann, N.; Rabe, M.; Jacobs, K.
Alternating-current thin-film electro-luminescent devices: effect of fabrication conditions on aging and failure defect formation
Here are a few pages on the site that we think you may find useful: