Publisher: Elsevier

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Volume 283, Number 1, June 2000

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Protein insertion within a biological freestanding film
pp. 1-5(5)
Authors: Cuvillier, N.; Petkova, V.; Nedyalkov, M.; Millet, F.; Benattar J.-J.

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Role of interfacial correlation in melting of Langmuir-Blodgett films
pp. 6-11(6)
Authors: Basu, J.K.; Sanyal, M.K.; Banerjee, S.; Mukherjee, M.

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Interfacial structures of block and graft copolymers with lamellar microphase-separated structures
pp. 12-16(5)
Authors: Torikai, N.; Matsushita, Y.; Langridge, S.; Bucknall, D.; Penfold, J.; Takeda, M.

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Structure of grafted polymers, investigated with neutron reflectometry
pp. 17-21(5)
Authors: Currie, E.P.K.; Wagemaker, M.; Stuart, M.A.C.; van Well, A.A.

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X-ray scattering from polymer films
pp. 22-26(5)
Authors: Tolan, M.; Seeck, O.H.; Wang, J.; Sinha, S.K.; Rafailovich, M.H.; Sokolov, J.

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Molecular layering in a liquid on a solid substrate: an X-ray reflectivity study
pp. 27-31(5)
Authors: Yu, C.; Richter, A.G.; Datta, A.; Durbin, M.K.; Dutta, P.

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Fully hydrated and highly oriented membranes: an experimental setup amenable to specular and diffuse X-ray scattering
pp. 32-36(5)
Authors: Vogel, M.; Munster, C.; Fenzl, W.; Thiaudiere, D.; Salditt, T.

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Organization of tethered polyoxazoline polymer brushes at the air/water interface
pp. 37-39(3)
Authors: Gutberlet, T.; Wurlitzer, A.; Dietrich, U.; Politsch, E.; Cevc, G.; Steitz, R.; Losche, M.

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Roughness correlations in ultra-thin polymer blend films
pp. 40-44(5)
Authors: Gutmann, J.S.; Muller-Buschbaum, P.; Schubert, D.W.; Stribeck, N.; Smilgies, D.; Stamm, M.

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X-ray scattering studies of imperfect manganese stearate Langmuir-Blodgett films
pp. 45-48(4)
Authors: Hazra, S.; Gibaud, A.; desert, A.; Gacem, V.; Cowlam, N.

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Adsorption of dodecahydroxylated-fullerene monolayers at the air-water interface
pp. 49-52(4)
Authors: Liu, W.; Jeng, U.; Lin T.-L.; Lai, S.; Shih, M.C.; Tsao, C.; Wang, L.Y.; Chiang, L.Y.; Sung, L.P.

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Dewetting of thin polymer-blend films examined with GISAS
pp. 53-59(7)
Authors: Muller-Buschbaum, P.; Gutmann, J.S.; Stamm, M.; Cubitt, R.; Cunis, S.; von Krosigk, G.; Gehrke, R.; Petry, W.

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Morphology of off-specular neutron scattering pattern from islands on a lamellar film
pp. 60-64(5)
Authors: Toperverg, B.; Lauter-Pasyuk, V.; Lauter, H.; Nikonov, O.; Ausserre, D.; Gallot, Y.

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Lateral and vertical ordering of self-assembled PbSe quantum dots studied by high-resolution X-ray diffraction
pp. 65-68(4)
Authors: Holy, V.; Stangl, J.; Springholz, G.; Pinczolits, M.; Bauer, G.; Kegel, I.; Metzger, T.H.

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Grazing-incidence small-angle X-ray scattering applied to the characterization of aggregates in surface regions
pp. 69-74(6)
Authors: Naudon, A.; Babonneau, D.; Thiaudiere, D.; Lequien, S.

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Phase-sensitive surface X-ray scattering study of a crystalline organic-organic heterostructure
pp. 75-78(4)
Authors: Schreiber, F.; Gerstenberg, M.C.; Edinger, B.; Toperverg, B.; Forrest, S.R.; Scoles, G.; Dosch, H.

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X-ray diffraction study of the 5-fold plane surface of a Al70.4Pd21.4Mn8.2 single-grain
pp. 79-83(5)
Authors: Capitan, M.J.; Calvayrac, Y.; Gratias, D.; Alvarez, J.

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Nonspecular scattering from extreme ultraviolet multilayer coatings
pp. 84-91(8)
Authors: Stearns, D.G.; Gullikson, E.M.

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Analysis of the strain distribution in lateral nanostructures for interpreting photoluminescence data
pp. 92-96(5)
Authors: Pietsch, U.; Darowski, N.; Ulyanenkov, A.; Grenzer, J.; Wang, K.H.; Forchel, A.

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Morphology of nanocermet thin films: X-ray scattering study
pp. 97-102(6)
Authors: Hazra, S.; Gibaud, A.; desert, A.; Sella, C.; Naudon, A.

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Grazing incidence X-ray studies of twist-bonded Si/Si and Si/SiO2 interfaces
pp. 103-107(5)
Authors: Buttard, D.; Eymery, J.; Rieutord, F.; Fournel, F.; Lubbert, D.; Baumbach, T.; Moriceau, H.

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Structural and morphological studies of Co/SiO2 discontinuous multilayers
pp. 114-118(5)
Authors: Thiaudiere, D.; Proux, O.; Micha, J.; Revenant, C.; Regnard, J.; Lequien, S.

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Multilayers for the EUV/soft X-ray range
pp. 119-124(6)
Author: Schafers, F.

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X-ray measurements of the depth dependence of stress in gold films
pp. 125-129(5)
Authors: Brennan, S.; Munkholm, A.; Leung, O.S.; Nix, W.D.

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In-plane strain and shape analysis of Si/SiGe nanostructures by grazing incidence diffraction
pp. 130-134(5)
Authors: Zhuang, Y.; Pietsch, U.; Stangl, J.; Holy, V.; Darowski, N.; Grenzer, J.; Zerlauth, S.; Schaffler, F.; Bauer, G.

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X-ray scattering study of porous silicon layers
pp. 135-138(4)
Authors: Chamard, V.; Dolino, G.; Stettner, J.

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Surface traveling X-rays from organic thin film
pp. 139-142(4)
Authors: Hayashi, K.; Kawai, J.

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Determination of the layered structure in Mo/Si multilayers by grazing incidence X-ray reflectometry
pp. 143-148(6)
Authors: Yakshin, A.E.; Louis, E.; Gorts, P.C.; Maas, E.L.G.; Bijkerk, F.

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Grazing incidence neutron diffraction from large scale 2D structures
pp. 149-152(4)
Authors: Toperverg, B.P.; Felcher, G.P.; Metlushko, V.V.; Leiner, V.; Siebrecht, R.; Nikonov, O.

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Synchrotron X-ray study of the epitaxial Co/Pt multilayers on Al2O3(1120) substrates with Pt/Mo buffer layers
pp. 153-156(4)
Authors: Lee C.-H.; Wu, L.C.; Yu, K.; Huang, J.C.A.; Jan, J.; Cheng, P.

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Roughness in sputtered multilayers analyzed by transmission electron microscopy and X-ray diffuse scattering
pp. 157-161(5)
Authors: Macrander, A.T.; Liu, C.; Csencsits, R.; Cook, R.; Kirk, M.; Headrick, R.

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Polarized neutron reflectivity characterization of weakly coupled Co/Cu multilayers
pp. 162-166(5)
Authors: Borchers, J.A.; Dura, J.A.; Majkrzak, C.F.; Hsu, S.Y.; Lolee, R.; Pratt, W.P.; Bass, J.

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Investigation of the magnetism in thin single Ho(00.1) films via neutron reflectivity measurements
pp. 167-170(4)
Authors: Leiner, V.; Labergerie, D.; Siebrecht, R.; Sutter, C.; Zabel, H.

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Soft X-ray magnetic scattering from striped magnetic domain structures
pp. 171-174(4)
Authors: van der Laan, G.; Dudzik, E.; Collins, S.P.; Dhesi, S.S.; Durr, H.A.; Belakhovsky, M.; Chesnel, K.; Marty, A.; Samson, Y.; Gilles, B.

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Chemical and magnetization profile study of Ce in [CeLaCe/Fe] and [LaCeLa/Fe] multilayers by resonant X-ray reflectivity
pp. 175-179(5)
Authors: Jaouen, N.; Tonnerre, J.M.; Bontempi, E.; Raoux, D.; Seve, L.; Bartolome, F.; Rogalev, A.; Muenzenberg, M.; Felsch, W.; Durr, H.A.; Dudzik, E.; Maruyama, H.

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Magnetism in lanthanide superlattices
pp. 180-183(4)
Authors: Goff, J.P.; Sarthour, R.S.; McMorrow, D.F.; Yakhou, F.; Stunault, A.; Ward, R.C.C.; Wells, M.R.

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Hydrogen absorption in epitaxial W/Nb(001) and polycrystalline Fe/Nb(110) multilayers studied in situ by X-ray/neutron scattering techniques and X-ray absorption spectroscopy
pp. 184-188(5)
Authors: Klose, F.; Rehm, C.; Fieber-Erdmann, M.; Holub-Krappe, E.; Bleif, H.J.; Sowers, H.; Goyette, R.; Troger, L.; Maletta, H.

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Polarization analysis of neutron reflectometry on non-collinear magnetic media: polarized neutron reflectometry experiments on a thin cobalt film
pp. 189-193(5)
Authors: van de Kruijs, R.W.E.; Fredrikze, H.; Rekveldt, M.T.; van Well, A.A.; Nikitenko, Y.V.; Syromyatnikov, V.G.

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Magnetic off-specular neutron scattering from Fe/Cr multilayers
pp. 194-198(5)
Authors: Lauter-Pasyuk, V.; Lauter, H.J.; Toperverg, B.; Nikonov, O.; Kravtsov, E.; Milyaev, M.A.; Romashev, L.; Ustinov, V.

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Roughness effects on magnetic properties of thin films
pp. 199-202(4)
Authors: Palasantzas, G.; Zhao, Y.; de Hosson, J.T.M.; Wang, G.

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Reflectivity and off-specular neutron scattering from ferrofluid
pp. 203-207(5)
Authors: Toperverg, B.; Vorobyev, A.; Gordeyev, G.; Nickel, B.; Donner, W.; Dosch, H.; Rekveldt, T.

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Oxidation of NiAl(100) studied with surface sensitive X-ray diffraction
pp. 208-211(4)
Authors: Stierle, A.; Formoso, V.; Comin, F.; Schmitz, G.; Franchy, R.

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Resonance X-ray scattering from Pt(1 1 1) surfaces under water
pp. 212-216(5)
Authors: You, H.; Chu, Y.S.; Lister, T.E.; Nagy, Z.; Ankudiniv, A.L.; Rehr, J.J.

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Transition between the 1x1 and (3x23)R30o surface structures of GaN in the vapor-phase environment
pp. 217-222(6)
Authors: Munkholm, A.; Thompson, C.; Stephenson, G.B.; Eastman, J.A.; Auciello, O.; Fini, P.; Speck, J.S.; denBaars, S.P.

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Morphology of Au(1,1,1) vicinal surfaces studied by grazing incidence X-ray diffraction
pp. 223-227(5)
Authors: Garreau, Y.; Repain, V.; Berroir, J.M.; Rousset, S.; Etgens, V.H.; Lecoeur, J.

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X-ray scattering from freely suspended smectic films: resolution and other effects
pp. 232-236(5)
Authors: Sentenac, D.; Fera, A.; Opitz, R.; Ostrovskii, B.I.; Bunk, O.; de Jeu, W.H.

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The genetic algorithm: refinement of X-ray reflectivity data from multilayers and thin films
pp. 237-241(5)
Authors: Ulyanenkov, A.; Omote, K.; Harada, J.

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Phase determination in neutron reflection
pp. 242-247(6)
Authors: Lipperheide, R.; Weber, M.; Leeb, H.

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Experimental demonstration of phase determination in neutron reflectometry by variation of the surrounding media
pp. 248-252(5)
Authors: Majkrzak, C.F.; Berk, N.F.; Silin, V.; Meuse, C.W.

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Use of advanced optics in a neutron liquids reflectometer
pp. 253-255(3)
Author: Ankner, J.F.

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The ID01 beamline at the E.S.R.F.: the diffuse scattering technique applied to surface and interface studies
pp. 256-261(6)
Authors: Capitan, M.J.; Thiaudiere, D.; Goirand, L.; Taffut, R.; Lequien, S.

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Selection of a model in reflectometry: use of the linear statistical inference
pp. 262-267(6)
Authors: Samoilenko, I.; Feigin, L.; Shchedrin, B.; Antolini, R.

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Bragg diffraction in a coherent X-ray scattering experiment
pp. 268-272(5)
Authors: Kaganer, V.M.; Jenichen, B.; Ploog, K.H.

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Overflowing cylinder for neutron reflection research at expanding surfaces
pp. 278-281(4)
Authors: Wagemaker, M.; Boerboom, F.J.G.; Bos, H.J.; van Well, A.A.

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On the use of a multilayer monochromator in neutron reflectometry
pp. 282-284(3)
Authors: van Well, A.A.; de Haan, V.O.; Fredrikze, H.; Clemens, D.

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Focusing of coherent X-rays in a tapered planar waveguide
pp. 285-288(4)
Authors: Zwanenburg, M.J.; Bongaerts, J.H.H.; Peters, J.F.; Riese, D.; van der Veen, J.F.

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