Publisher: Elsevier

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Volume 57, Number 10, 15 October 2002

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Editorial Board
pp. CO2-CO2(1)

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Editorial
pp. 1491-1492(2)

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Echelle-spectrograph as a tool for studies of structured background in flame atomic absorption spectrometry
pp. 1493-1504(12)
Authors: Becker-Ross, H.; Okruss, M.; Florek, S.; Heitmann, U.; Huang, M.D.

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Characterization of a double-pass spray chamber for ICP spectrometry by computer simulation (CFD)
pp. 1505-1520(16)
Authors: Schaldach, G.; Berger, L.; Razilov, I.; Berndt, H.

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New methodical and instrumental developments in laser ablation inductively coupled plasma mass spectrometry
pp. 1535-1545(11)
Authors: Hoffmann, E.; Ludke, C.; Skole, J.; Stephanowitz, H.; Wollbrandt, J.; Becker, W.

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Ion mobility spectrometer for online monitoring of trace compounds
pp. 1563-1574(12)
Authors: Li, F.; Xie, Z.; Schmidt, H.; Sielemann, S.; Baumbach, J.I.

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Micro-structured analytical instrumentation for the analysis of liquids
pp. 1575-1583(9)
Authors: Grasz, B.; Weber, G.; Neyer, A.; Schilling, M.; Hergenroder, R.

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Plasmas for lab-on-the-chip applications
pp. 1585-1592(8)
Authors: Miclea, M.; Kunze, K.; Franzke, J.; Niemax, K.

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Depth profiles of a shallow implanted layer in a Si wafer determined by different methods of thin-layer analysis
pp. 1593-1599(7)
Authors: Klockenkamper, R.; Becker, H.W.; Bubert, H.; Jenett, H.; von Bohlen, A.

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Basic analytical investigation of plasma-chemically modified carbon fibers
pp. 1601-1610(10)
Authors: Bubert, H.; Ai, X.; Haiber, S.; Heintze, M.; Bruser, V.; Pasch, E.; Brandl, W.; Marginean, G.

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Spectroscopic infrared ellipsometry to determine the structure of layered samples
pp. 1625-1634(10)
Authors: Korte E.-H.; Hinrichs, K.; Roseler, A.

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Bio-analytical applications of mid-infrared spectroscopy using silver halide fiber-optic probes
pp. 1649-1663(15)
Authors: Heise, H.M.; Kupper, L.; Butvina, L.N.

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