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Publisher: Elsevier

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Volume 55, Number 3, 31 March 2000

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Total-reflection X-ray fluorescence analysis of geological microsamples
pp. 205-212(8)
Authors: Ebert, M.; Mair, V.; Tessadri, R.; Hoffmann, P.; Ortner, H.M.

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Investigation of matrix effect on dry inductively coupled plasma conditions using laser ablation sampling
pp. 221-235(15)
Authors: Chan, G.C.; Chan, W.; Mao, X.; Russo, R.E.

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Extension of the dynamic range of the wavelength-modulated diode laser absorption spectrometry technique
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Authors: Gustafsson, J.; Chekalin, N.; Rojas, D.; Axner, O.

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