Skip to main content

Publisher: Elsevier

Volume 54, Number 12, 22 November 1999

Electrospray mass spectrometry: a tool for elemental speciation
pp. 1649-1695(47)
Author: Stewart, I.I.

Favourites:
ADD

A compact small-beam XRF instrument for in-situ analysis of objects of historical and/or artistic value
pp. 1697-1710(14)
Authors: Vittiglio, G.; Janssens, K.; Vekemans, B.; Adams, F.; Oost, A.

Favourites:
ADD

Monte Carlo simulation of X-ray fluorescence spectra: Part 4. Photon scattering at high X-ray energies
pp. 1711-1722(12)
Authors: Vincze, L.; Janssens, K.; Vekemans, B.; Adams, F.

Favourites:
ADD
Favourites:
ADD

Gas leak detection by diode laser absorption spectrometry
pp. 1737-1741(5)
Authors: Uhl, R.; Reinhardt, T.; Haas, U.; Franzke, J.

Favourites:
ADD
Favourites:
ADD
Favourites:
ADD

Access Key

Free Content
Free content
New Content
New content
Open Access Content
Open access content
Subscribed Content
Subscribed content
Free Trial Content
Free trial content
Cookie Policy
X
Cookie Policy
ingentaconnect website makes use of cookies so as to keep track of data that you have filled in. I am Happy with this Find out more