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Publisher: Elsevier

Volume 54, Number 10, 25 October 1999

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Future in-fab applications of total reflection X-ray fluorescence spectrometry for the semiconductor industry
pp. 1393-1398(6)
Authors: Iltgen, K.; Zschech, E.; Ghatak-Roy, A.; Hossain, T.

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Enhanced analysis of particles and vapor phase decomposition droplets by total-reflection X-ray fluorescence
pp. 1409-1426(18)
Authors: Funahashi, M.; Matsuo, M.; Kawada, N.; Yamagami, M.; Wilson, R.

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Low Z total reflection X-ray fluorescence analysis - challenges and answers
pp. 1433-1441(9)
Authors: Streli, C.; Kregsamer, P.; Wobrauschek, P.; Gatterbauer, H.; Pianetta, P.; Pahlke, S.; Fabry, L.; Palmetshofer, L.; Schmeling, M.

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Measurement of trace element concentration in a metal matrix using total reflection X-ray fluorescence spectrometry
pp. 1443-1447(5)
Authors: van Aarle, J.; Abela, R.; Hegedus, F.; Streli, C.; Victoria, M.; Winkler, P.; Wobrauschek, P.

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An electrochemical enrichment procedure for the determination of heavy metals by total-reflection X-ray fluorescence spectroscopy
pp. 1449-1454(6)
Authors: Ritschel, A.; Wobrauschek, P.; Chinea, E.; Grass, F.; Fabjan, C.

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Determination of copper, iron and zinc in spirituous beverages by total reflection X-ray fluorescence spectrometry
pp. 1463-1468(6)
Authors: Capote, T.; Marco, L.M.; Alvarado, J.; Greaves, E.D.

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The use of total-reflection X-ray fluorescence to track the metabolism and excretion of selenium in humans
pp. 1481-1485(5)
Authors: Bellisola, G.; Pasti, F.; Valdes, M.; Torboli, A.

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The application of resonantly enhanced X-ray standing waves in fluorescence and waveguide experiments
pp. 1487-1495(9)
Authors: Jark, W.; Di Fonzo, S.; Cedola, A.; Lagomarsino, S.

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Total-reflection X-ray fluorescence imaging
pp. 1497-1503(7)
Author: Sakurai, K.

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Optimization of TXRF measurements by variable incident angles
pp. 1505-1511(7)
Authors: Prange, A.; Reus, U.; Schwenke, H.; Knoth, J.

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A formula for the background in TXRF as a function of the incidence angle and substrate material
pp. 1513-1515(3)
Authors: Knoth, J.; Prange, A.; Reus, U.; Schwenke, H.

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Determination of silicon in organic matrices with grazing-emission X-ray fluorescence spectrometry
pp. 1517-1524(8)
Authors: Claes, M.; van Dyck, K.; deelstra, H.; van Grieken, R.

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Quantification in grazing-emission X-ray fluorescence spectrometry
pp. 1525-1537(13)
Authors: Spolnik, Z.M.; Claes, M.; van Grieken, R.E.; de Bokx, P.K.; Urbach, H.P.

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Grazing incidence X-ray photoemission spectroscopy of SiO2 on Si
pp. 1539-1544(6)
Authors: Jach, T.; Gormley, J.; Thurgate, S.

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