Publisher: Elsevier

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Volume 54, Number 1, 4 January 1999

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K-line X-ray fluorescence analysis of high-Z elements
pp. 29-39(11)
Authors: Harada, M.; Sakurai, K.

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Review on grazing incidence X-ray spectrometry and reflectometry
pp. 41-82(42)
Authors: Stoev, K.N.; Sakurai, K.

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Light element analysis in steel by high-energy heavy-ion time of flight elastic recoil detection analysis
pp. 151-157(7)
Authors: Hong, W.; Hayakawa, S.; Maeda, K.; Fukuda, S.; Gohshi, Y.

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K-edge X-ray absorption spectra of argon in sputtered aluminum films
pp. 159-162(4)
Authors: Takemura, M.; Satake, H.; Yasuami, S.; Yoshiki, M.; Kitajima, Y.

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A wavelength dispersive X-ray spectrometer for small area X-ray fluorescence spectroscopy at SPring-8 BL39XU
pp. 171-177(7)
Authors: Hayakawa, S.; Yamaguchi, A.; Hong, W.; Gohshi, Y.; Yamamoto, T.; Hayashi, K.; Kawai, J.; Goto, S.

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Calculation of Anisotropic C K X-ray Emission Spectra of Carbons and Related Materials
pp. 179-187(9)
Authors: Kim, S.; Kawai, J.; Motoyama, M.; Adachi, H.; Park, S.

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Molecular orbital calculation of graphite K-V X-ray emission spectra
pp. 189-196(8)
Authors: Kaneyoshi, T.; Kowada, Y.; Tanaka, T.; Kawai, J.; Motoyama, M.

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X-ray Spectroscopic Analysis of Solid State Reaction during Mechanical Alloying
pp. 197-203(7)
Authors: Yamada, K.; Takahashi, T.; Motoyama, M.

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X-ray absorption fine structure (XAFS) of Si wafer measured using total reflection X-rays
pp. 215-222(8)
Authors: Kawai, J.; Hayakawa, S.; Kitajima, Y.; Gohshi, Y.

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Grazing incidence X-ray absorption spectra of (Si/W) 100/Si multilayer
pp. 223-226(4)
Authors: Hayashi, K.; Amano, H.; Yamamoto, T.; Kawai, J.; Kitajima, Y.; Takenaka, H.

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Refracted X-rays propagating near the surface under grazing incidence condition
pp. 227-230(4)
Authors: Hayashi, K.; Kawai, J.; Moriyama, Y.; Horiuchi, T.; Matsushige, K.

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