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Cumulative indices for Spectrochima Acta, Part A and Spectrochimica Acta, Part B
Scheeline, A.; Williams, B.; Williksen, E.; Jeffrey; McEnroe, B.
Spectral interferences in the determination of traces of scandium, yttrium and rare earth elements in ''pure'' rare earth matrices by inductively coupled plasma atomic emission spectrometry. Part IV. Lutetium and yttrium
Velichkov, S.; Kostadinova, E.; Daskalova, N.
An electronic spectroscope for classroom displays of visible spectra
Knight, J.B.; Farnsworth, P.B.
The influence of hyperfine structure and isotope shift on the detection of Rb by 2f-wavelength modulation diode laser absorption spectrometry-experimental verification of simulations
Gustafsson, J.; Axner, O.
Speciation of chromium by ion chromatography and laser-enhanced ionization: optimization of the excitation-ionization scheme
Paquet, P.M.; Gravel, J.; Nobert, P.; Boudreau, D.
Investigation of laser ablated metal and polymer plasmas in ambient gas using fast photography
Thareja, R.K.; Misra, A.; Franklin, S.R.
Flow injection determination of selenium by successive retention of Se(IV) and tetrahydroborate(III) on an anion-exchange resin and hydride generation electrothermal atomization atomic absorption spectrometry with in-atomizer trapping - Part 1. Method development and investigation of interferences
Carrero, P.E.; Tyson, J.F.
Uranium determination at ppb levels by X-ray fluorescence after its preconcentration on polyurethane foam
Carvalho, M.S.; Domingues, M.d.L.F.; Mantovano, J.L.; Filho, E.Q.S.
Tunable UV generation at 283nm by frequency doubling and sum frequency mixing of two semiconductor lasers for the detection of Pb
Franzke, J.; Fox, R.W.; Hollberg, L.
Analysis of glass and glass melts during the vitrification process of fly and bottom ashes by laser-induced plasma spectroscopy. Part I: Normalization and plasma diagnostics
Panne, U.; Haisch, C.; Clara, M.; Niessner, R.
Analysis of glass and glass melts during the vitrification of fly and bottom ashes by laser-induced plasma spectroscopy. Part II. Process analysis
Panne, U.; Clara, M.; Haisch, C.; Niessner, R.