Ultramicroscopy

IFC (Editorial Board)
pp. CO2-CO2(1)

A modeling and convolution method to measure compositional variations in strained alloy quantum dots
pp. 1-18(18)
Authors: Crozier P.A.; Catalano M.; Cingolani R.

Theoretical analysis of the atomic force microscopy characterization of columnar thin films
pp. 19-29(11)
Author: Klapetek P.

Mean free paths for inelastic electron scattering in silicon and poly(styrene) nanospheres
pp. 31-35(5)
Authors: Chou T.M.; Libera M.

A comparison of EDS microanalysis in FIB-prepared and electropolished TEM thin foils
pp. 37-48(12)
Authors: Hutchinson C.R.; Hackenberg R.E.; Shiflet G.J.

Thermal behaviour modelling of tapered optical fibres for scanning near-field microscopy
pp. 49-69(21)
Authors: Thiery L.; Marini N.