Ultramicroscopy

IFC (Editorial Board)
pp. CO2-CO2(1)

The separation of surface and bulk contributions in ELNES spectra
pp. 91-97(7)
Authors: Schattschneider P.; Stoger M.; Hebert C.; Jouffrey B.

Mapping the mesoscale interface structure in polycrystalline materials
pp. 99-109(11)
Authors: Wu C.T.; Adams B.L.; Bauer C.L.; Casasent D.; Morawiec A.; Ozdemir S.; Talukder A.

A trajectory-based algorithm to determine and refine Euler angles of projections in three-dimensional microscopy. Improvements and tests
pp. 111-121(11)
Authors: Bellon P.L.; Cantele F.; Carlo S.D.; Lanzavecchia S.

Direct compositional analysis of AlGaAs/GaAs heterostructures by the reciprocal space segmentation of high-resolution micrographs
pp. 123-137(15)
Authors: Tillmann K.; Luysberg M.; Specht P.; Weber E.R.

Atomic configuration in core structure of Lomer dislocation in Si_0.76Ge_0.24/Si
pp. 139-146(8)
Authors: Wang D.; Chen H.; Li F.H.; Kawasaki K.; Oikawa T.

Fluctuation microscopy in the STEM
pp. 147-159(13)
Authors: Voyles P.M.; Muller D.A.

Moire-like fringes in transmission electron microscopy images of coherently strained semiconductor islands
pp. 161-167(7)
Authors: Androussi Y.; Benabbas T.; Lefebvre A.

An assay for local quality in cryo-electron micrographs of single particles
pp. 169-178(10)
Authors: Gao H.; Spahn C.M.T.; Grassucci R.A.; Frank J.