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Publisher: Elsevier

Volume 210, Number 3, 15 April 2003
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Editorial Board
pp. ii-ii(1)

Author index
pp. I-II

Subject Index
pp. III-IX(1)

Formation of high quality gallium nitride thin films on Ga-diffused Si(1 1 1) substrate
pp. 153-157(5)
Authors: Xue C.; Yang L.; Wang C.; Zhuang H.; Wei Q.

Formation of p-type ZnO film on InP substrate by phosphor doping
pp. 177-182(6)
Authors: Bang K.-H.; Hwang D.-K.; Park M.-C.; Ko Y.-D.; Yun I.; Myoung J.-M.

Comparison of the electroluminescence and its related properties of two cyclopentadiene derivatives
pp. 183-189(7)
Authors: Gao X.-C.; Cao H.; Huang L.; Huang Y.-Y.; Zhang B.-W.; Huang C.-H.

XPS, FTIR and TPR characterization of Ru/Al2O3 catalysts
pp. 222-230(9)
Authors: Mazzieri V.; Coloma-Pascual F.; Arcoya A.; L'Argentiere P.C.; Fgoli N.S.

Formation of luminescent (NH4)2SiF6 phase from vapour etching-based porous silicon
pp. 240-248(9)
Authors: Saadoun M.; Bessas B.; Mliki N.; Ferid M.; Ezzaouia H.; Bennaceur R.

Electrical characterization of low temperature deposited TiO2 films on strained-SiGe layers
pp. 249-254(6)
Authors: Dalapati G.K.; Chatterjee S.; Samanta S.K.; Maiti C.K.

Increased surface roughness by oxygen plasma treatment of graphite/polymer composite
pp. 255-261(7)
Authors: Cvelbar U.; Pejovnik S.; Mozetie M.; Zalar A.

Comparison of nanosecond laser ablation at 1064 and 308 nm wavelength
pp. 262-273(12)
Authors: Torrisi L.; Gammino S.; Ando L.; Nassisi V.; Doria D.; Pedone A.

Crystalline silicon films sputtered on molybdenum - A study of the silicon-molybdenum interface
pp. 301-306(6)
Authors: Reinig P.; Fenske F.; Fuhs W.; Schopke A.; Selle B.

Picosecond and femtosecond pulsed laser ablation and deposition of quasicrystals
pp. 307-317(11)
Authors: Teghil R.; D'Alessio L.; Santagata A.; Zaccagnino M.; Ferro D.; Sordelet D.J.

The effect of the proton on electropolymerization of the thiophene
pp. 338-345(8)
Authors: Can M.; Sevin F.; Yildiz A.

The thermal spreading of antimony oxides onto Fe2O3
pp. 346-352(7)
Authors: Huang Y.; Wang G.; Valenzuela R.X.; Corberan V.C.

Annealing effects on structure and laser-induced damage threshold of Ta2O5/SiO2 dielectric mirrors
pp. 353-358(6)
Authors: Zhao Y.; Wang Y.; Gong H.; Shao J.; Fan Z.

Cuprite, paramelaconite and tenorite films deposited by reactive magnetron sputtering
pp. 359-367(9)
Authors: Pierson J.F.; Thobor-Keck A.; Billard A.

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