Applied Surface Science

Structural stability of ultrathin silicon oxynitride film improved by incorporated nitrogen
pp. 171-176(6)
Authors: Suzuki M.; Saito Y.

Phase transitions in excimer laser irradiated zirconia thin films
pp. 177-183(7)
Authors: Starbova K.; Mankov V.; Starbov N.; Popov D.; Nihtianova D.; Kolev K.; Laude L.D.

Composition of the surface layer of GaAs after laser annealing of the Al-GaAs system
pp. 184-192(9)
Authors: Demireva D.; Ziffudin L.

XPS investigation of Upilex-S polyimide ablated by 355 nm Nd:YAG laser irradiation
pp. 193-202(10)
Authors: Yung K.C.; Zeng D.W.; Yue T.M.

Stability of an ultra-thin Fe film on a Cu(1 0 0) surface studied by positron-annihilation induced Auger electron spectroscopy (PAES)
pp. 203-207(5)
Authors: Kim J.H.; Lee K.H.; Yang G.; Koymen A.R.; Weiss A.H.

Studies of pore structure, temperature-programmed reduction performance, and micro-structure of CuO/CeO₂ catalysts
pp. 208-220(13)
Authors: Xiaoyuan J.; Guanglie L.; Renxian Z.; Jianxin M.; Yu C.; Xiaoming Z.

Electrochemical intercalation of perchlorate ions in HOPG: an SFM/LFM and XPS study
pp. 221-232(12)
Authors: Schnyder B.; Alliata D.; Kotz R.; Siegenthaler H.

TiC and TaC deposition by pulsed laser ablation: a comparative approach
pp. 233-241(9)
Authors: Teghil R.; D'Alessio L.; Zaccagnino M.; Ferro D.; Marotta V.; De Maria G.

Evaporated copper on surface modified polyaniline films
pp. 242-251(10)
Authors: Ma Z.H.; Tan K.L.; Chua W.S.; Kang E.T.; Neoh K.G.

Analysis of the laser-induced reduction mechanisms of medieval pigments
pp. 252-261(10)
Authors: Pouli P.; Emmony D.C.; Madden C.E.; Sutherland I.

The growth of sodium rough films on mica(0 0 0 1) as determined by helium atom scattering
pp. 262-269(8)
Authors: Gerlach R.; Balzer F.; Rubahn H.-G.

Surface morphology and electronic structure of Ge/Si(1 1 1) 7x7 system
pp. 270-281(12)
Authors: Lobo A.; Gokhale S.; Kulkarni S.K.

Phase transformation of diamond films during electron field emission
pp. 282-289(8)
Authors: Sun Z.; Chen J.S.; Li Y.J.; Tay B.K.; Lau S.P.; Chen G.Y.

Low grain size TiN thin films obtained by low energy ion beam assisted deposition
pp. 290-295(6)
Authors: Lopez J.M.; Gordillo-Vazquez F.J.; Bohme O.; Albella J.M.

Specific defect sites creation by doping MgO with lithium and titanium
pp. 296-306(11)
Authors: Balint I.; Aika K.-i.

Investigation of the structural and electrical properties of Sr_1-xBi_2.2Ta₂O₉ thin films with deficient Sr contents
pp. 307-312(6)
Authors: Li A.; Ling H.; Wu D.; Yu T.; Wang M.; Yin X.; Liu Z.; Ming N.

Preparation of silicon carbide nitride thin films by sputtering of silicon nitride target
pp. 313-317(5)
Authors: Peng X.; Song L.; Meng J.; Zhang Y.; Hu X.

Interfacial layer formation in Gd₂O₃ films deposited directly on Si(0 0 1)
pp. 318-326(9)
Authors: Gupta J.A.; Landheer D.; Sproule G.I.; McCaffrey J.P.; Graham M.J.; Yang K.-C.; Lu Z.-H.; Lennard W.N.

Surface oxidation of Al-Cr-Fe alloys characterized by X-ray photoelectron spectroscopy
pp. 327-338(12)
Authors: Demange V.; Anderegg J.W.; Ghanbaja J.; Machizaud F.; Sordelet D.J.; Besser M.; Thiel P.A.; Dubois J.M.

Surface modification of silicon and silica in biological environment: an X-ray photoelectron spectroscopy study
pp. 339-351(13)
Authors: Seal S.; Barr T.L.; Krezoski S.; Petering D.

Effects of substrate temperature on the film characteristics and gas-sensing properties of copper phthalocyanine films
pp. 352-361(10)
Authors: Lee Y.-L.; Tsai W.-C.; Maa J.-R.

Study on the relation between surface roughness and the light emission spectrum of an Au-Al₂O₃-Al tunnel junction
pp. 362-367(6)
Authors: Wang M.-X.; Zhang Y.-W.; Cheng H.-W.; Sun C.-X.

The electronic structure and location of H pairs in bcc Fe edge dislocation
pp. 368-379(12)
Authors: Pronsato M.E.; Brizuela G.; Juan A.

AUTHOR INDEX
pp. 381-383(3)

SUBJECT INDEX
pp. 385-396(12)