Applied Surface Science

Magnetite scale cluster adhesion on metal oxides surfaces: atomistic simulation study
pp. 175-188(14)
Authors: Ohira T.; Inoue Y.; Murata K.; Murayama J.

Roughness fractal approach of oxidised surfaces by AFM and diffuse X-ray reflectometry measurements
pp. 189-196(8)
Authors: Arnault J.C.; Knoll A.; Smigiel E.; Cornet A.

Secondary electron emission data of cesiated oxygen free high conductivity copper(II)
pp. 197-206(10)
Authors: Hopman H.J.; Zeijlemaker H.; Verhoeven J.

Capacitance-voltage characteristic of anisotype heterojunction in the presence of interface states and series resistance
pp. 207-212(6)
Authors: Chattopadhyay P.; Haldar D.P.

Analytical evaluation of tapping mode atomic force microscopy for chemical imaging of surfaces
pp. 213-225(13)
Authors: Basnar B.; Friedbacher G.; Brunner H.; Vallant T.; Mayer U.; Hoffmann H.

Surface modification of oxide thin film and its gas-sensing properties
pp. 226-230(5)
Authors: Maosong T.; Guorui D.; Dingsan G.

Reversible phase change in Bi_xSe_100-x chalcogenide thin films for using as optical recording medium
pp. 231-241(11)
Authors: Hafiz M.M.; El-Shazly O.; Kinawy N.

Discoloration of marble during laser cleaning by Nd:YAG laser wavelengths
pp. 242-251(10)
Authors: Klein S.; Fekrsanati F.; Hildenhagen J.; Dickmann K.; Uphoff H.; Marakis Y.; Zafiropulos V.

An organic functional group introduced to Si(1 1 1) via silicon&unknown;carbon bond: a liquid-phase approach
pp. 252-256(5)
Authors: Okubo T.; Tsuchiya H.; Sadakata M.; Yasuda T.; Tanaka K.

Evaporation of silver thin films on mica
pp. 257-264(8)
Authors: Levlin M.; Laakso A.

Spectromicroscopy of interfacial interactions between thin Ni films and a Au-Si surface
pp. 265-274(10)
Authors: Gregoratti L.; Barinov A.; Casalis L.; Kiskinova M.

Cu wetting and interfacial stability on clean and nitrided tungsten surfaces
pp. 275-282(8)
Authors: Ekstrom B.M.; Lee S.; Magtoto N.; Kelber J.A.

HREELS study of electron irradiation effects on ammonia adsorbed on the Ge (1 0 0) surface
pp. 283-287(5)
Authors: Sanders M.; Craig J.H.

Characterisation of surface processes on metals under pulsed picosecond laser irradiation by photoelectric work function measurements
pp. 288-305(18)
Authors: Vouagner D.; Belezna C.; Girardeau-Montaut J.P.

The cadmium seleniophosphate (CdPSe₃) XPS and XAES spectra
pp. 306-313(8)
Authors: Calareso C.; Grasso V.; Silipigni L.

Energy loss spectra of thin films of aluminum on niobium
pp. 314-327(14)
Authors: Wu Z.; Dickey J.M.