Applied Surface Science

Analysis of the sidewall films formed during Si trench etching with photoresist mask in Cl₂/HBr-based plasma
pp. 1-8(8)
Authors: Lee S.-D.; Nam S.-Y.; Ha J.-H.; Park J.-W.

Associative oxygen species on the oxidized silver surface formed under O₂ microwave excitation
pp. 9-14(6)
Authors: Boronin A.I.; Koscheev S.V.; Murzakhmetov K.T.; Avdeev V.I.; Zhidomirov G.M.

The surface structure of Dow Cyclotene 3022, as determined by photoacoustic FTIR, confocal Raman and photoelectron spectroscopies
pp. 15-22(8)
Authors: Poulin S.; Yang D.Q.; Sacher E.; Hyett C.; Ellis T.H.

Initial stages of oxidation of a 9CrMoV-steel: role of segregation and martensite laths
pp. 23-33(11)
Authors: Tokei Z.; Viefhaus H.; Grabke H.J.

XPS analysis of Pb(Zr_0.52Ti_0.48)O₃ thin film after dry-etching by CHF₃ plasma
pp. 34-37(4)
Authors: Lin Y.-y.; Liu Q.; Tang T.-a.; Yao X.

Scanning tunneling microscopy observation of dislocations with superlattice structure in graphite
pp. 38-43(6)
Author: Ouseph P.J.

Ion time-of-flight analysis of ultrashort pulsed laser-induced processing of Al₂O₃
pp. 44-55(12)
Authors: Stoian R.; Varel¹ H.; Rosenfeld A.; Ashkenasi D.; Kelly R.; Campbell E.E.B.

Preparation and electrochromic properties of Li-doped MoO₃ films fabricated by the peroxo sol-gel process
pp. 56-59(4)
Authors: Zhang Y.; Kuai S.; Wang Z.; Hu X.

Systematic study of the surface morphology of ordered (GaIn)P
pp. 60-69(10)
Authors: Pietzonka I.; Sasz¹ T.; Gottschalch V.

Analysis of the NiCo₂O₄ spinel surface with Auger and X-ray photoelectron spectroscopy
pp. 70-84(15)
Authors: Kim J.-G.; Pugmire D.L.; Battaglia D.; Langell M.A.