Minimizing the cost of fault location when testing from a finite state machine

Author: Hierons R.M.

Source: Computer Communications, Volume 22, Number 2, 25 January 1999 , pp. 120-127(8)

Publisher: Elsevier

Keywords: Finite state machine; Fault location; Adaptive testing; Minimal length test

Language: English

Document Type: Research article

DOI: http://dx.doi.org/10.1016/S0140-3664(98)00251-5

Affiliations: 1: Department of Mathematical and Computing Sciences, Goldsmiths College, University of London, London, UK

Publication date: 1999-01-25

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