Publisher: Elsevier

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Volume 28, Number 6, August 1999

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Technological entry, exit and survival: an empirical analysis of patent data
pp. 643-660(18)
Authors: Hardan, A.; Birmaher, B.; Williamson, D.E.; Dahl, R.E.; Ambrosini, P.; Rabinovich, H.; Ryan, N.D.; Malerba, F.; Orsenigo, L.

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