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Publisher: Elsevier

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Volume 72, Number 2, 24 October 2003

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Growth types and surface topography of Co, Cu and Co/Cu multilayers studied by AES and STM/SFM
pp. 97-101(5)
Authors: Marszalek, M.; Jaworski, J.; Wider, H.; Schatz, G.

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Study and improvement of interfacial properties in a MIS structure based on p-type InP
pp. 123-127(5)
Authors: Chellali, M.; Tizi, S.; Benamara, Z.; Amrani, M.; Boudissa, A.; Talbi, A.; Gruzza, B.

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Modification of zirconium oxide film microstructure during post-deposition annealing
pp. 135-141(7)
Authors: Ciosek, J.; Paszkowicz, W.; Pankowski, P.; Firak, J.; Stanislawek, U.; Patron, Z.

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Surface morphology effects of post-implantation annealing in thin amorphous films of the As-Se system
pp. 143-147(5)
Authors: Tsvetkova, T.; Balabanov, S.; Skordeva, E.; Kitova, S.; Sielanko, J.; Maczka, D.; Zuk, J.

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Wireless communication using detectors located inside vacuum chambers
pp. 149-155(7)
Authors: Murari, A.; Lotto, L.

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Permeation-type helium-detecting probe
pp. 157-160(4)
Authors: Rama Rao, V.V.K.; Gor, M.K.

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Mass-transport driven by surface instabilities under high-flux, low-energy nitrogen ion irradiation at elevated temperatures
pp. 161-168(8)
Authors: Pranevicius, L.; Pranevicius, L.L.; Milcius, D.; Muzard, S.; Templier, C.; Riviere, J.

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Optical investigations of the indium selenide glasses
pp. 169-175(7)
Author: El-Sayed, S.M.

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Dependence of field-emission threshold in diamond-like carbon films grown by various techniques
pp. 183-192(10)
Authors: Panwar, O.S.; Kumar, S.; Rajput, S.S.; Sharma, R.; Bhattacharyya, R.

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Direct ion beam deposited carbon films and clusters
pp. 193-198(6)
Authors: Kopustinskas, V.; Meskinis, S.; Tamulevicius, S.; Niaura, G.; Guobiene, A.; Grigaliunas, V.

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Effect of copper on boride layer of boronized ductile cast irons
pp. 199-204(6)
Authors: Sen, U.; Sen, S.; Yilmaz, F.

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Simulation of island behavior in discontinuous film growth
pp. 205-210(6)
Authors: Levchenko, I.; Baranov, O.

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Erratum to ''Tribological study of vanadium-based alloys ion implanted at low energy and high temperature'' [Vacuum 67 (2002) 543-550]
pp. 211-211(1)
Authors: Garcia, J.A.; Rodriguez, R.; Sanchez, R.; Martinez, R.; Riviere, J.P.; Meheust, P.; Varela, M.; Caceres, D.; Munoz, A.; Ballesteros, C.

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