Publisher: Elsevier

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Volume 71, Number 1, 9 May 2003

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AES depth profiling of thermally treated Al/Si thin-film structures
pp. 11-17(7)
Authors: Zalar, A.; Wang, J.Y.; Zhao, Y.H.; Mittemeijer, E.J.; Panjan, P.

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Influence of Pd-Co bimetallic interaction on CO adsorption properties of PdxCo1-x alloys: XPS, TPD and static SIMS studies
pp. 41-45(5)
Authors: Matolnova, I.; Fabk, S.; Masek, K.; Sedlacek, L.; Skala, T.; Veltruska, K.; Matoln, V.

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Reconstruction of low-count step-like signals in ion microbeam analysis
pp. 53-57(5)
Authors: Kovacs, M.; Kantor, Z.; Simon, A.; Frey, K.

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Analysis of 2D GISAXS patterns obtained on semiconductor nanocrystals
pp. 65-70(6)
Authors: Buljan, M.; Salamon, K.; Dubcek, P.; Bernstorff, S.; Desnica-Frankovic, I.D.; Milat, O.; Desnica, U.V.

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Pt/ceria thin film model catalysts after high-temperature reduction: a (HR)TEM study
pp. 71-76(6)
Authors: Penner, S.; Rupprechter, G.; Sauer, H.; Su, D.S.; Tessadri, R.; Podloucky, R.; Schlogl, R.; Hayek, K.

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Microstructural investigation of NbC-doped vacuum-sintered tool-steel-based composites
pp. 77-82(6)
Authors: Sustarsic, B.; Jenko, M.; Godec, M.; Kosec, L.

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Extending UHV studies to the mbar range: vibrational SFG spectroscopy of high-pressure CO adsorption on Pt(111) and Pd(111)
pp. 83-87(5)
Authors: Rupprechter, G.; Unterhalt, H.; Morkel, M.; Galletto, P.; Dellwig, T.; Freund, H.

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Characterisation of desorbing molecules by REMPI-TOF spectroscopy: the system H2 (D2)-V(100)+O
pp. 95-99(5)
Authors: Gleispach, D.; Kailbauer, P.; Winkler, A.

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DFT calculations of (111) surfaces of Au, Cu, and Pt: stability and reconstruction
pp. 101-106(6)
Authors: Crljen, Z.; Sokcevic, D.; Brako, R.; Lazic, P.

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The effect of adsorbed CO on the surface chemistry of CH3 on Rh(111)
pp. 107-111(5)
Authors: Kecskes, T.; Barthos, R.; Rasko, J.; Kiss, J.

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InP Schottky junctions for zero bias detector diodes
pp. 113-116(4)
Authors: Horvath, Z.J.; Rakovics, V.; Szentpali, B.; Puspoki, S.; Zd'ansky, K.

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IBIC Studies of structural defect activity in different polycrystalline silicon material
pp. 117-122(6)
Authors: Borjanovic, V.; Jaksic, M.; Pastuovic, Z.; Pivac, B.; Katz, E.

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Interstitial defects in ion-implanted Si
pp. 129-133(5)
Authors: Kovacevic, I.; Borjanovic, V.; Pivac, B.

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UV light induced defects in amorphous silicon thin films
pp. 135-139(5)
Authors: Pivac, B.; Pavlovic, M.; Kovacevic, I.; Etlinger, B.; Zulim, I.

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Gap states produced by oxygen precipitation in Czochralski silicon
pp. 141-145(5)
Authors: Pivac, B.; Ilic, S.; Borghesi, A.; Sassella, A.; Porrini, M.

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Experimental determination of electron inelastic scattering cross-sections in Si, Ge and III-V semiconductors
pp. 147-152(6)
Authors: Orosz, G.T.; Gergely, G.; Gurban, S.; Menyhard, M.; Toth, J.; Varga, D.; Tougaard, S.

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Thermoelectric effect spectroscopy measurements on semi-insulating GaN
pp. 153-158(6)
Authors: Pavlovic, M.; Desnica, U.V.; Fang, Z.; Look, D.C.

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TEM investigation of defect structure in GaAlN/GaN heterostructures
pp. 159-163(5)
Authors: Makkai, Z.; Pecz, B.; di Forte-Poisson, M.A.

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Gold nanotube: structure and melting
pp. 165-169(5)
Author: Bilalbegovic, G.

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Carbon nano-particles prepared by ion-clustering in plasma
pp. 171-176(6)
Authors: Pocsik, I.; Veres, M.; Fule, M.; Koos, M.; Kokavecz, J.; Toth, Z.; Radnoczi, G.

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Fullerene-like structures in CNx particles
pp. 185-191(7)
Authors: Radnoczi, G.; Kovacs, G.J.; Pecz, B.; Geszti, O.; Safran, G.

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H density in a hydrogen plasma post-glow reactor
pp. 201-205(5)
Authors: Mozetic, M.; Vesel, A.; Monna, V.; Ricard, A.

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Improvement of electrical conductivity of Cu/Ag glue joints by discharge cleaning
pp. 207-211(5)
Authors: Cvelbar, U.; Mozetic, M.; Zalar, A.

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On the dynamics of unipolar and bipolar pulsed d.c. discharges used for plasma CVD
pp. 219-223(5)
Authors: Fink, M.; Laimer, J.; Stori, H.

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Discharge characteristics of magnetron cells with different lengths in ultrahigh vacuum
pp. 225-228(4)
Authors: Vesel, A.; Mozetic, M.; Zalar, A.

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In-band EUV radiation of ablative capillary discharges in PVC
pp. 229-232(4)
Authors: Andreic, Z.; Ellwi, S.; Pleslic, S.; Kunze, H.

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Discharge cleaning of aluminum components
pp. 233-236(4)
Authors: Mozetic, M.; Zalar, A.

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Sputter deposition and film characterization of NiAl on sapphire fibres
pp. 241-246(6)
Authors: Reichert, K.; Martnez, C.; Kyrsta, S.; Cremer, R.; Neuschutz, D.

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Solid-state wetting and spreading of tin (Sn) on aluminium interfaces
pp. 253-259(7)
Authors: Eisenmenger-Sittner, C.; Bangert, H.; Bergauer, A.; Brenner, J.; Stori, H.; Barna, P.B.

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Carbon-containing Ti-C:H and Cr-C:H PVD hard coatings
pp. 261-265(5)
Authors: Panjan, P.; Cekada, M.; Merl, D.K.; Macek, M.; Navinsek, B.; Jesih, A.; Zalar, A.; Jenko, M.

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UHV Se evaporation source: room-temperature deposition on a clean V(110) surface
pp. 267-271(5)
Authors: Mandrino, D.; Milun, M.; Jenko, M.

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Effect of hydrostatic pressure on crystallization and decomposition in amorphous Si/SiSb/Si system
pp. 273-277(5)
Authors: Papp, Z.; Csik, A.; Erdelyi, G.; Langer, G.A.; Beke, D.L.; Daroczi, L.; Simon, A.; Kapta, K.

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Thermal stability of PVD hard coatings
pp. 279-284(6)
Authors: Mitterer, C.; Mayrhofer, P.H.; Musil, J.

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Microstructure of GaN layers grown on Si(111) revealed by TEM
pp. 285-291(7)
Authors: Dobos, L.; Pecz, B.; Feltin, E.; Beaumont, B.; Gibart, P.

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Formation of oriented silver telluride on single and polycrystalline Ag films
pp. 299-305(7)
Authors: Safran, G.; Geszti, O.; Radnoczi, G.

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Influence of the substrate coating temperature on the vacuum properties of Ti-Zr-V non-evaporable getter films
pp. 307-315(9)
Authors: Benvenuti, C.; Chiggiato, P.; Pinto, P.C.; Prodromides, A.; Ruzinov, V.

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Mechanism of non-evaporable getter activation XPS and static SIMS study of Zr44V56 alloy
pp. 317-322(6)
Authors: Matoln, V.; Drbohlav, J.; Masek, K.

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Static SIMS study of Ti, Zr, V and Ti-Zr-V NEG activation
pp. 323-327(5)
Authors: Drbohlav, J.; Matolin, V.

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The dependence of the Becker gauge calibration curve on the gas molecular mass
pp. 335-339(5)
Authors: Gronych, T.; Repa, P.; Peksa, L.; Palacky, J.

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