Microstructure and electrical properties of Ag-MgF2 cermet films with high Ag content

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Keywords: Ag-MgF2 cermet films; Composition; Electrical properties; Microstructure

Document Type: Research Article

DOI: http://dx.doi.org/10.1016/S0042-207X(02)00300-7

Affiliations: CCAST World Lab., P.O. Box 8730, 100080, Beijing, People's Republic of China

Publication date: October 31, 2002

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