Publisher: Elsevier

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Volume 62, Number 1, 25 May 2001

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An improved microchip thin film transformer formed by vacuum evaporation and sputtering
pp. 1-6(6)
Authors: Zhang, H.W.; Liu, Y.L.; Zhong, Z.Y.

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Influence of Xe+-ion irradiation on the microstructure of diamond-like carbon films
pp. 15-19(5)
Authors: Faizrakhmanov, I.A.; Bazarov, V.V.; Zhikharev, V.A.; Stepanov, A.L.; Khaibullin, I.B.

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Structure and properties of Al2O3 and Al2O3+Cr2O3 coatings deposited to steel 3 (0.3wt%C) substrate using pulsed detonation technology
pp. 21-26(6)
Authors: Pogrebnjak, A.D.; Il'jashenko, M.; Kul'ment'eva, O.P.; Kshnjakin, V.S.; Kobzev, A.P.; Tyurin, Y.N.; Kolisnichenko, O.

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Characterization of AgGa0.25In0.75Se2 thin films
pp. 39-45(7)
Authors: Chandra, G.H.; Hussain, O.M.; Uthanna, S.; Naidu, B.S.

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XPS, AES and EELS studies of Al surfaces
pp. 47-60(14)
Author: Paparazzo, E.

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CuIn(SxSe1-x)2 films prepared by graphite box annealing of In/Cu stacked elemental layers
pp. 61-73(13)
Authors: Bandyopadhyaya, S.; Roy, S.; Chaudhuri, S.; Pal, A.K.

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