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Publisher: Elsevier

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Volume 60, Number 4, March 2001

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Volume 60 Author Index
pp. vii-viii(2)

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Preface
pp. vii-vii(1)
Authors: Avasthi, D.D.K.; Gupta, P.A.; Das, D.N.C.

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Study of thin film multilayers using X-ray reflectivity and scanning probe microscopy
pp. 371-376(6)
Authors: Banerjee, S.; Datta, A.; Sanyal, M.K.

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Multilayer growth facilities and studies at IUC-DAEF: a review
pp. 377-383(7)
Author: Dasannacharya, B.A.

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X-ray multilayer optics: growth and characterization
pp. 385-388(4)
Authors: Lodha, G.S.; Raghuvanshi, V.K.; Modi, M.H.; Tripathi, P.; Verma, A.; Nandedkar, R.V.

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Microstructural study of iron nitride thin films deposited by ion beam sputtering
pp. 395-399(5)
Authors: Gupta, M.; Gupta, A.; Chaudhari, S.M.; Phase, D.M.; Ganesan, V.; Rama Rao, M.V.; Shripathi, T.; Dasannacharya, B.A.

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Effect of interface structure correlation on magnetoresistance of Fe/Cr multilayers
pp. 401-405(5)
Authors: Paul, A.; Gupta, A.; Chaudhari, S.M.; Phase, D.M.

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DC magnetization studies in Nb/Fe superconducting multilayers
pp. 407-410(4)
Authors: Chaudhari, S.M.; Chaudhary, S.; Roy, S.B.; Chaddah, P.; Dasannacharya, B.A.

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Spectroscopic ellipsometry of multilayer dielectric coatings
pp. 419-424(6)
Authors: Bhattacharyya, D.; Sahoo, N.K.; Thakur, S.; Das, N.C.

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Characterisation of molecular beam epitaxy-grown InGaAs multilayer structures using photoluminescence
pp. 425-429(5)
Authors: Srinivasan, T.; Muralidharan, R.; Mehta, S.K.; Jain, B.P.; Singh, S.N.; Jain, R.K.; Kumar, V.

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Preparation of layered semiconductor (MoSe2) by electrosynthesis
pp. 431-435(5)
Authors: Joseph Sahaya Anand, T.; Sanjeeviraja, C.; Jayachandran, M.

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