Vacuum logo Elsevier logo

Publisher: Elsevier

Related content
Volume 57, Number 1, April 2000

< previous issue | all issues | next issue >

Thermal stability of nitride thin films
pp. 1-30(30)
Author: Hultman, L.

Structural and electrical properties of HgTe thin films
pp. 31-41(11)
Authors: Seyam, M.A.M.; Elfalaky, A.

Chemical analysis of the plasma-polymerized diphenyl thin films
pp. 43-50(8)
Authors: Chowdhury, F.; Islam, A.B.M.O.; Bhuiyan, A.H.

Investigations on the effect of alpha particle irradiation-induced defects near Pd/n-GaAs interface
pp. 51-59(9)
Authors: Jayavel, P.; Kumar, J.; Santhakumar, K.; Magudapathy, P.; Nair, K.G.M.

Homologous micro-clusters of carbon disulphide
pp. 61-70(10)
Authors: Michalak, L.; Pelc, A.

LEED study of Ni (100) and (111) surface damage caused by Ar+ ion bombardment with low energy and small doses
pp. 71-80(10)
Authors: Vasylyev, M.A.; Blaschuk, A.G.; Mashovets, N.S.; Vilkova, N.Y.

Phosphorus concentration profile in silicon produced by means of the nuclear reaction 30Si(p,)31P
pp. 81-85(5)
Authors: Garcia-Molina, R.; Heredia-Avalos, S.; Abril, I.

Flicker noise of the channel electron multiplier
pp. 99-104(6)
Authors: Grzeszczak, A.; Kaszczyszyn, S.; Klein, S.

< previous issue | all issues | next issue >


Free Content
Free content
New Content
New content
Open Access Content
Open access content
Subscribed Content
Subscribed content
Free Trial Content
Free trial content

Text size:

A | A | A | A
Share this item with others: These icons link to social bookmarking sites where readers can share and discover new web pages. print icon Print this page