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Publisher: Elsevier

Volume 47, Number 1, January 1996

A multiple target system using laser ablation for multilayer deposition
pp. 1-3(3)
Authors: Campion, R.P.; King, P.J.; Dye, D.R.; Ormson, R.G.

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Coadsorption of hydrogen and potassium on silver single crystal surfaces
pp. 5-11(7)
Authors: Zhukov, V.; Rendulic, K.D.; Winkler, A.

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A cesium sputter negative ion source using a multi-laminate wire mesh ionizer
pp. 23-25(3)
Authors: Gui-Yue, J.; Wen-Xun, W.; Cheng-Zhou, J.

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Effects of the electron beam on InP(100)
pp. 27-32(6)
Authors: Bouslama, M.; Monteil, Y.; Younes, G.; Jardin, C.; Ghamnia, M.

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ERD: Hydrogen profiling and application to the lattice expansion study
pp. 35-38(4)
Authors: Touchrift, B.; Benouali, N.; Salah, H.

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Gallium arsenide etching using ion beams from hydrogen/methane mixtures
pp. 39-44(6)
Authors: Villalvilla, J.M.; Santos, C.; Valles-Abarca, J.A.; Valles-Abarca, J.A.

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Transport properties of thin Cd3As2 polycrystalline films
pp. 45-48(4)
Authors: El-Shazly, A.A.; Soliman, H.S.; El-Sayed, H.E.A.; El-Hady, D.A.A.

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Optical absorption behaviour of AgSbTe2 thin films
pp. 49-51(3)
Authors: Zayed, H.A.; Ibrahim, A.M.; Soliman, L.I.

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Optical properties of Cd3As2 polycrystalline thin films
pp. 53-56(4)
Authors: El-Shazly, A.A.; Soliman, H.S.; El-Sayed, H.E.A.; El-Hady, D.A.A.; El-Hady, D.A.A.

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The effect of substrate temperature on oxygen absorption during simultaneous ion bombardment and Ag deposition on Si
pp. 57-60(4)
Authors: Mickus, A.; Galdikas, A.; Pranevicus, L.; Tamulevicus, S.; Pranevicus, L.; Tamulevicus, S.

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Kinetics of solid-phase interactions in thin-film Cu/Ti system with an excess of Cu
pp. 61-65(5)
Authors: Uzunov, T.; Stojanov, S.P.; Uzunov, T.D.; Lambov, S.I.; Stojanov, S.P.

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An XPS study of compositional changes induced by argon ion bombardment of the LaPO4 surface
pp. 67-71(5)
Authors: Ivanova, O.P.; Naumkin, A.V.; Vasilyev, L.A.

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Alkali metal generators with a constant stream
pp. 79-82(4)
Authors: Chuntonov, K.A.; Postovalov, V.G.

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Surface oxidation studies of Al/Cu thin films
pp. 83-85(3)
Authors: Thomas, P.V.; Vaidyan, V.K.; Abraham, J.T.

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Digital mixer for quartz crystal thickness monitor
pp. 87-89(3)
Authors: Shivalingappa, L.; Srinivasan, M.P.; Mohan, S.

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Physical investigations of DC magnetron sputtered indium tin oxide films
pp. 91-93(3)
Authors: Uthanna, S.; Reddy, P.S.; Naidu, B.S.; Reddy, P.J.

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