High resolution hydrogen profiling in superconducting materials by ion beam analysis (ERD-EXB)

Authors: Roux B.; Chevarier A.; Chevarier N.; Wybourn B.; Antoine C.; Cantacuzene S.; Bosland P.; Bonin B.

Source: Vacuum, Volume 46, Number 7, July 1995 , pp. 629-632(4)

Publisher: Elsevier

Language: English

Document Type: Research article

DOI: http://dx.doi.org/10.1016/0042-207X(95)00008-9

Affiliations: 1: Institut de Physique Nucleaire de Lyon, IN2P3-CNRS et Universite Claude Bernard, 43 Bd. du 11 Novembre 1918, F-69622 Villeurbanne Cedex, France

Publication date: 1995-07-01

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• In this Subject: Mechanics
• By this author: Roux B. ;  Chevarier A. ;  Chevarier N. ;  Wybourn B. ;  Antoine C. ;  Cantacuzene S. ;  Bosland P. ;  Bonin B.

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