Publisher: Elsevier

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Volume 46, Number 7, July 1995

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High resolution hydrogen profiling in superconducting materials by ion beam analysis (ERD-EXB)
pp. 629-632(4)
Authors: Roux, B.; Chevarier, A.; Chevarier, N.; Wybourn, B.; Antoine, C.; Cantacuzene, S.; Bosland, P.; Bonin, B.

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Study of hydrogen in DLC film by ERDA with i58Ni ions
pp. 633-636(4)
Authors: Barshilia, H.C.; vankar, V.D.; Mehta, B.R.; Sah, S.; Kabiraj, D.; Mehta, G.K.; Avasthi, D.K.

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Topography development on selected inert gas and self-ion bombarded Si
pp. 637-643(7)
Authors: Vishnyakov, V.; Carter, G.; Goddard, D.T.; Nobes, M.J.

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A review of ion beam assisted deposition of optical thin films
pp. 645-659(15)
Authors: Mohan, S.; Ghanashyam Krishna, M.

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In-situ low temperature cleaning of silicon surfaces using hydrogen atoms
pp. 667-672(6)
Authors: Crossley, A.; Sofield, C.J.; Sugden, S.; Clampitt, R.; Bradley, C.

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Study of annealed indium tin oxide films prepared by rf reactive magnetron sputtering
pp. 673-680(8)
Authors: Meng, L.; Macarico, A.; Martins, R.; Meng L.-J.

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Effect of a pre-filter on the sensitivity of a high-resolution quadrupole mass spectrometer
pp. 681-683(3)
Authors: Hiroki, S.; Abe, T.; Murakami, Y.; Sakata, K.; Sugiyama, N.; Muramoto, S.

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The effect of self-ions bombardment on the structure and properties of thin metal films
pp. 685-690(6)
Authors: Kononenko, O.V.; Matveev, V.N.; Kislov, N.A.; Khodos, I.I.; Kasumov, A.Y.

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Development and testing of a high temperature quartz crystal microbalance
pp. 691-694(4)
Authors: Mecea, V.M.; Carlsson, J.O.; Heszler, P.; Bartan, M.

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Conduction mechanism in the pre-switching state of thin films containing Te As Ge Si
pp. 701-707(7)
Authors: Elsamanoudy, M.M.; Hegab, N.A.; Fadel, M.

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The turbomolecular pump in molecular state
pp. 709-715(7)
Authors: Antoniou, A.G.; Valamontes, S.E.; Panos, C.N.; Valamontes, E.S.

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Active process control of reactive sputter deposition
pp. 723-729(7)
Authors: Voevodin, A.A.; Stevenson, P.; Rebholz, C.; Schneider, J.M.; Matthews, A.

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Irradiation effects of He4e+ beam on zeolites and hydrogenated silicon
pp. 731-735(5)
Authors: Salah, H.; Touchrift, B.; Tobbeche, S.; Azzouz, A.

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Metal-InP thin film reactions: Studies using mass and energy dispersive recoil spectrometry
pp. 737-738(2)
Authors: Whitlow, H.J.; Hult, M.; Persson, L.; El Bouanani, M.; Andersson, M.; Ostling, M.; Zaring, C.; Lundberg, N.; Cohen, D.D.; Dytlewski, N.; Bubb, I.F.; Johnston, P.N.; Walker, S.R.

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Study of the microstructure and optical properties of polycrystalline Cd1-xZnxTe thin films
pp. 739-743(5)
Authors: Samanta, B.; Sharma, S.L.; Chaudhuri, A.K.

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Evaporation of tungsten oxides: A mass-spectrometric study of the vapour contents
pp. 745-747(3)
Authors: Azens, A.; Kitenbergs, M.; Kanders, U.

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