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Publisher: Elsevier

Volume 46, Number 3, March 1995

CVV Auger line shapes in FeS2
pp. 211-217(7)
Authors: Raikar, G.N.; Thurgate, S.M.

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A reliable compact ultra-high vacuum scanning tunneling microscope
pp. 219-222(4)
Authors: Lyubinetsky, I.V.; Mel'nik, P.V.; Nakhodkin, N.G.; Anisimov, A.E.

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Electron temperature measurements in uhv systems by spectroscopic and Langmuir probe techniques
pp. 223-226(4)
Authors: desai, T.M.; Gogawale, S.V.; Shukla, A.B.; Joshi, N.K.; Salgaonkar, U.S.; Bhale, G.L.

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Effect of sample temperature on the irradiation effects of energetic particles in the YBCO system
pp. 227-228(2)
Authors: Das, S.K.; Ashwini Kumar, P.K.; Sarkar, S.K.; Kanjilal, D.; Senapati, L.

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Deposition and properties of titanium nitride films produced by dc reactive magnetron sputtering
pp. 233-239(7)
Authors: Meng L.-J.; Dos Santos, M.P.; Azevedo, A.

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Surface morphology of films having columnar grains
pp. 241-245(5)
Authors: Bhattacharyya, D.; Chaudhuri, S.; Pal, A.K.

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The influence of surface topographic features on angular distribution of sputtered atoms
pp. 247-250(4)
Authors: Zhenxia, W.; Jisheng, P.; Jiping, Z.; Zhenlan, T.; Wenmin, W.; Huiming, Z.; Yuewu, Z.

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Hydrogen profiling and the stoichiometry of an a-SiNx:H film
pp. 265-267(3)
Authors: Avasthi, D.K.; Mehta, G.K.; Acharya, M.G.; Tarey, R.D.; Malhotra, L.K.

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Investigation of multilayered Ge/Si structures with varying thicknesses
pp. 269-276(8)
Authors: Kiselev, N.A.; Lebedev, O.I.; Vasiliev, A.L.; Antipov, M.V.; Orlikovsky, A.A.; Valiev, K.A.; Vasiliev, A.G.

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Simulation of isotope effects in the sputtering of u-63Cu-65Cu
pp. 277-280(4)
Authors: Zheng L.-P.; Li, R.; Li, D.

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Study on depth profiles of hydrogen in the surface region of metal by ERDA
pp. 295-297(3)
Authors: Changgeng, L.; Yongqiang, W.; Shengsheng, Y.; Hui, J.; Zhihao, Z.

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Studies of atom beams produced by a saddle field source used for depositing diamond-like carbon films on glass
pp. 299-303(5)
Authors: Voevodin, A.A.; Caperaa, C.; Schneider, J.M.; Stevenson, P.; Matthews, A.

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On the ion energy transfer to the substrate during titanium deposition in a hollow cathode arc discharge
pp. 305-308(4)
Authors: Kersten, H.; Steffen, H.; Wagner, H.E.; Vender, D.

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Determination of optical constants and band gaps of bilayered semiconductor films
pp. 309-313(5)
Authors: Bhattacharyya, D.; Chaudhuri, S.; Pal, A.K.

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Electrical properties of thin gold films on (3-Mercaptopropyl)trimethoxysilane (MPS) treated glass substrates
pp. 315-318(4)
Authors: Newton, M.I.; McHale, G.; Hooper, P.D.; Willis, M.R.; Burt, S.D.

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Absorption tail of polycrystalline semiconductor films
pp. 319-322(4)
Authors: Maity, A.B.; Bhattacharyya, D.; Chaudhuri, S.; Pal, A.K.

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