Thin Solid Films

Room temperature reduction of MERIE-like plasma-induced interface states
pp. 1-6(6)
Author: Atanassova E.

Characterization of IrO₂ thin films by Raman spectroscopy
pp. 7-11(5)
Authors: Liao P.C.; Chen C.S.; Ho W.S.; Huang Y.S.; Tiong K.K.

Ellipsometric characterization of an AISI 304 stainless steel protective coating
pp. 12-16(5)
Authors: Fuentes-Gallego J.J.; Blanco E.; Esquivias L.

Electrical and structural characteristics of chromium thin films deposited on glass and alumina substrates
pp. 17-22(6)
Authors: Kulkarni A.K.; Chang L.C.

Morphology and microstructure of polypyrrole formed by electrochemical polymerization
pp. 23-27(5)
Authors: Shan J.; Yuan C.; Zhang H.

In situ reflection high energy electron bombardment analysis of biaxially oriented yttria-stabilized zirconia thin film growth on amorphous substrates
pp. 28-34(7)
Authors: Betz V.; Holzapfel B.; Schultz L.

Low temperature zirconia thin film synthesis by a chemical vapour deposition process involving ZrCl₄ and O₂-H₂-Ar microwave post-discharges. Comparison with a conventional CVD hydrolysis process
pp. 35-44(10)
Authors: Gavillet J.; Belmonte T.; Hertz D.; Michel H.

Analysis of thin film stress measurement techniques
pp. 45-54(10)
Authors: Malhotra S.G.; Rek Z.U.; Yalisove S.M.; Bilello J.C.

Depth-sensitive strain analysis of a W-Ta-W trilayer
pp. 55-61(7)
Authors: Malhotra S.G.; Rek Z.U.; Yalisove S.M.; Bilello J.C.

Monitoring the deposition of Cu thin film using the double exposure holographic interferometry technique
pp. 62-64(3)
Authors: Dongre M.B.; Fulari V.J.; Kulkarni H.R.

Deposition of cubic boron nitride layers - characterisation of substrate-layer interface
pp. 65-70(6)
Authors: Barth K.-L.; Sigle W.; Stockle D.; Ulmer J.; Lunk A.

Synthesis of tungsten carbide thin films by reactive pulsed laser deposition
pp. 71-76(6)
Authors: Chitica N.; Gyorgy E.; Lita A.; Marin G.; Mihailescu I.N.; Pantelica D.; Petrascu M.; Hatziapostolou A.; Grivas C.; Broll N.; Cornet A.; Mirica C.; Andrei A.

Enhanced diamond nucleation on pretreated silicon substrates
pp. 77-81(5)
Authors: Shen M.-R.; Wang H.; Ning Z.-Y.; Ye C.; Gan Z.-Q.; Ren Z.-X.

Oxygen sensing properties of V₂O₅ cladded optical glass waveguide
pp. 82-89(8)
Authors: Ansari Z.A.; Karekar R.N.; Aiyer R.C.

In situ TEM observation of metastable phase formed by solid state interdiffusion in a Co-Cu system
pp. 90-94(5)
Authors: Wu P.; Jiang E.Y.; Liu Y.G.; Wang C.D.

Photoelectrolytic micelle disruption method for preparation of free patterns of pigment images
pp. 95-104(10)
Authors: Harima Y.; Matsumoto K.; Wang Y.-D.; Yamashita K.

TEM characterization of plasma-sprayed thermal barrier coatings and ceramic-metal interfaces after hot isostatic pressing
pp. 105-114(10)
Authors: Chen H.C.; Heberlein J.; Pfender E.

Structural and optical characterization of polycrystalline CuInSe₂
pp. 115-121(7)
Authors: Schon J.H.; Alberts V.; Bucher E.

Photoconductivity - a novel method of evaluation of thin semiconducting film thickness
pp. 122-125(4)
Authors: Pohoryles B.; Morawski A.

Raman studies of diamond film growth on fuse-silica substrates by a multi-step process
pp. 126-133(8)
Authors: Lin G.L.; Lue J.T.; Chen C.L.; Lin I.N.

Qualitative characterization of variation in elastic properties of solid solutions by acoustic microscopy
pp. 134-141(8)
Authors: Cros B.; Nounah H.; Attal J.

Diffusion barrier properties of TaC between Si and Cu
pp. 142-148(7)
Authors: Imahori J.; Oku T.; Murakami M.

Optical properties of nickel thin films deposited by electroless plating
pp. 149-153(5)
Authors: Dumont E.; Dugnoille B.; Petitjean J.P.; Barigand M.

Dependence of the properties of (Sr_xTi_1-x)O₃ thin films deposited by plasma-enhanced metal-organic chemical vapor deposition on electron cyclotron resonance plasma
pp. 154-161(8)
Authors: Lee J.S.; Song H.W.; Jun B.-H.; Kwack D.H.; Yu B.G.; Jiang Z.-T.; No K.

Spontaneous aggregation of octaalkoxyphthalocyanine metal complexes at an air-water interface
pp. 162-168(7)
Authors: Matsuzawa Y.; Seki T.; Ichimura K.

Interaction of flurbiprofen sodium with cornea model monolayers at the air-water interface
pp. 169-174(6)
Authors: Garca M.L.; Egea M.A.; Valero J.; Valls O.; Alsina M.A.

Electropolymerization of pyrrole and 4-(3-Pyrrolyl)butane-sulfonate on Pt substrate: An in situ EQCM study
pp. 175-182(8)
Authors: Hwang B.J.; Shieh D.T.; Chieh W.C.; Liaw D.-J.; Li L.-J.

Modification of diamond films by high-energy ion irradiation: ''track channelling'' and ion charge fluctuation effects
pp. 183-187(5)
Authors: Fedotov S.A.; Byeli A.V.; Zaitsev A.M.; Varichenko V.S.; Kazyutchits N.M.

The role of a thin amorphous silicon layer in the fabrication of micro-pored silicon
pp. 188-191(4)
Authors: Kyu Kim E.; Lee M.-S.; Chel Choi W.; Nyung Lee H.; Suk-Ki Min; Lyou J.

The preparation, characterization of amorphous Cu-TCNQ film with a low degree of charge-transfer (DCT) and its electric switching properties
pp. 192-196(5)
Authors: Sun S.; Wu P.; Zhu D.

Amorphous r.f.-sputtered Si_100-xNi_x thin films with 0=<x=<15 at.: Structural, optical and electrical properties
pp. 197-202(6)
Authors: Belu-Marian A.; Serbanescu M.D.; Manaila R.; Stoica T.; Dragomir A.; Zavaliche F.; Tanase M.; Devenyi A.

Structure-related optical properties of laser-deposited Ba_xSr_1-xTiO₃ thin films grown on MgO (001) substrates
pp. 203-210(8)
Authors: Thielsch R.; Kaemmer K.; Holzapfel B.; Schultz L.

Magnetic and magneto-optical properties of (Pt/Co/Pt/Ni) multilayers
pp. 211-216(6)
Authors: Srinivas G.; Shin S.-C.

MgO/YBa₂Cu₃O_7-x multilayer thin films grown on (100) LaAlO₃ by pulsed laser deposition
pp. 217-224(8)
Author: Rao M.R.

Molecular orientation in liquid crystals on a photochromic polyion complex LB film by FTIR spectroscopy
pp. 225-229(5)
Author: Kawai T.

Characterization of unintentionally or lightly doped polysilicon films by improved Hall effect measurements
pp. 230-235(6)
Authors: Le Bihan F.; Fortin B.; Cauneau S.; Briand D.; Bonnaud O.

Synthesis of multicolor Nb₂O₅ coatings for electrochromic devices
pp. 236-241(6)
Authors: Pawlicka A.; Atik M.; Aegerter M.A.

Anodic corrosion of indium tin oxide films induced by the electrochemical oxidation of chlorides
pp. 242-248(7)
Authors: Folcher G.; Cachet H.; Froment M.; Bruneaux J.

Logarithmic dependence of the surface anisotropy on the low-angle X-ray diffraction intensity in Co-based multilayers
pp. 249-252(4)
Authors: Kim J.-H.; Shin S.-C.