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Publisher: Elsevier

Volume 300, Number 1, 28 May 1997
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Fractal structure and optical properties of semicontinuous silver films
pp. 1-5(5)
Authors: Shek C.H.; Lin G.M.; Li J.L.; Lai J.K.L.

Deposition of BaTiO3 thin films by plasma MOCVD
pp. 6-10(5)
Authors: Chiba T.; Itoh K.-I.; Matsumoto O.

Influence of substrate properties on the growth of titanium films: part II
pp. 11-17(7)
Authors: Poppeller M.; Abermann R.

Diamond films deposited on WC-Co substrates by use of barrier interlayers and nano-grained diamond seeds
pp. 18-24(7)
Authors: Konyashin I.Y.; Guseva M.B.; Babaev V.G.; Khvostov V.V.; Lopez G.M.; Alexenko A.E.

Conductivity model for sputtered ZnO-thin film gas sensors
pp. 30-41(12)
Authors: Weiszenrieder K.-S.; Muller J.

Thermal stability and crystallization of amorphous Si1-xBx, Si1-xPx and Si1-xSbx alloy thin films
pp. 51-58(8)
Authors: Carlsson J.R.A.; Sundgren J.-E.; Madsen L.D.; Hentzell H.T.G.; Li X.-H.

(Fe,Ti)16N2 films with high saturation magnetization prepared by facing target sputtering
pp. 59-63(5)
Authors: Wang H.Y.; Jiang E.Y.; Wang C.D.; Ming S.L.

Growth of Ti:sapphire single crystal thin films by pulsed laser deposition
pp. 68-71(4)
Authors: Anderson A.A.; Eason R.W.; Hickey L.M.B.; Jelenik M.; Grivas C.; Fotakis C.; Lane D.; Rogers K.

Ring etching zones on magnetron sputtering targets
pp. 72-77(6)
Authors: Golan G.; Axelvitch A.

Stability of plasma-deposited amorphous hydrogenated boron films
pp. 101-106(6)
Authors: Jacob W.; Annen A.; Sasz M.; Beckmann R.

Microstructure modification of amorphous titanium oxide thin films during annealing treatment
pp. 113-121(9)
Authors: Martin N.; Rousselot C.; Rondot D.; Palmino F.; Mercier R.

Microstructural changes of Pt/Ti bilayer during annealing in different atmospheres - An XRD study
pp. 122-130(9)
Authors: Ehrlich A.; Hoyer W.; Weisz U.; Geszner T.

Formation of amorphous anodic oxide films of controlled composition on aluminium alloys
pp. 131-137(7)
Authors: Skeldon P.; Habazaki H.; Thompson G.E.; Wood G.C.; Shimizu K.

Electrical properties of evaporated polycrystalline Ge thin-films
pp. 138-143(6)
Authors: Kobayashi H.; Uchida T.; Yasuoka Y.; Inoue N.

Laser deposition of oriented BiMeVO(x) films
pp. 154-158(5)
Authors: Pell J.W.; Zur Loye H.-C.; Auyeung R.C.Y.; Chrisey D.B.

An organic antitarnish coating on tinplate
pp. 159-163(5)
Authors: Keping H.; Jingli F.

Oxidation behavior of (Ti1-xAl(x))N films prepared by r.f. reactive sputtering
pp. 171-176(6)
Authors: Inoue S.; Uchida H.; Koterazawa K.; Yoshinaga Y.

Study of the delamination of diamond coatings under thermal stress
pp. 189-196(8)
Authors: Knuyt G.; Quaeyhaegens C.; Stals L.M.; Vandierendonck K.; Van Stappen M.

A new type of organic-inorganic multilayer: Fabrication and photoelectric properties
pp. 208-212(5)
Authors: Zhang J.; Wang D.; Chen Y.; Li T.; Mao H.; Tian H.; Zhou Q.; Xu H.

Formation of WSi-based ohmic contacts to n-type GaAs
pp. 218-222(5)
Authors: Oku T.; Furumai M.; Uchibori C.J.; Murakami M.

Specular beam intensity and surface morphology of BSCO films grown by MBE
pp. 223-227(5)
Authors: Tambo T.; Konishi S.; Takeda S.; Yamada N.; Ueba H.; Tatsuyama C.

Semifluorinated TTF derivatives in Langmuir-Blodgett films
pp. 228-233(6)
Authors: Delhaes P.; Mingotaud C.; Agricole B.; Cousseau J.; Nozdryn T.; Gorgues A.

Thin films of liquid crystal fumarates and a related acrylate
pp. 234-239(6)
Authors: Bardosova M.; Clarke I.; Hodge P.; Tredgold R.H.; Woolley M.

Resistance calculations for thin film rectangles
pp. 256-264(9)
Author: Hall P.M.

Adsorption of proteins on electro-conductive polymer films
pp. 265-271(7)
Authors: Khan G.F.; Wernet W.

The effect of rapid thermal annealing on structural and electrical properties of TiB2 thin films
pp. 272-277(6)
Authors: Todorovic B.; Jokic T.; Rakocevic Z.; Markovic Z.; Gakovic B.; Nenadovic T.

Zn diffusion of In0.5Ga0.5P investigated by photoluminescence measurements
pp. 284-288(5)
Authors: Park H.L.; Yoon I.T.; Jeong B.S.

Determination of hydrogen absorption in Pd coated Al thin films
pp. 295-298(4)
Authors: Azofeifa D.E.; Clark N.; Amador A.; Saenz A.

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