On mechanical contacts to porous silicon

Authors: Mares J.J.1; Kristofik J.; Hubik P.

Source: Thin Solid Films, Volume 295, Number 1, 28 February 1997 , pp. 305-309(5)

Publisher: Elsevier

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Keywords: Contacts; Electrical properties and measurements; Resistivity; Silicon

Language: English

Document Type: Research article

DOI: 10.1016/S0040-6090(96)09318-2

Affiliations: 1: Institute of Physics, Academy of Sciences of the Czech Republic, Cukrovarnicka 10, Praha 6, Czech Republic

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