Preparation and characterization of oxidized silver thin films

Authors: Pettersson L.A.A.; Snyder P.G.

Source: Thin Solid Films, Volume 270, Number 1, 1 December 1995 , pp. 69-72(4)

Publisher: Elsevier

Keywords: Silver oxide; Atomic oxygen; Optical constants; Spectroscopic ellipsometry

Language: English

Document Type: Research article

DOI: http://dx.doi.org/10.1016/0040-6090(96)80069-1

Affiliations: 1: Department of Electronic Engineering and Center for Microelectronic and Optical Materials Research, University of Nebraska-Lincoln, Lincoln, NE 68588-0511, USA

Publication date: 1995-12-01

• In this: publication
• By this: publisher
• In this Subject: Electrical & Nuclear Engineering ,  Nuclear Physics
• By this author: Pettersson L.A.A. ;  Snyder P.G.

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