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Publisher: Elsevier

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Volume 432, Number 3, 20 July 1999

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A synchrotron study of the deposition of vanadia on TiO2(110)
pp. 178-188(11)
Authors: Biener, J.; Baumer, M.; Madix, R.J.

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Growth, electronic properties and reactivity of vanadium deposited onto a thin alumina film
pp. 189-198(10)
Authors: Baumer, M.; Biener, J.; Madix, R.J.

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Effects of oxygen dosing on Ca cluster yields and energy distributions
pp. 199-210(12)
Authors: Hansen, C.S.; Calaway, W.F.; Pellin, M.J.; King, B.V.; Wucher, A.

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Silver deposition on oil - cluster nucleation, growth and aggregation on a liquid surface
pp. 228-238(11)
Authors: Michely, T.; Ye, G.; Weidenhof, V.; Wuttig, M.

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Defects and energy barriers in the Si(100)-Sb and Si(100)-As surfaces: a theoretical study
pp. 239-244(6)
Authors: Gonzalez Mendez, M.E.; Takeuchi, N.

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In situ determination of the shape of supported silver clusters during growth
pp. 257-264(8)
Authors: Wenzel, T.; Bosbach, J.; Stietz, F.; Trager, F.

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Single Cs adatoms at Si(001)2x1 surfaces: a local surface photovoltage imaging study
pp. 265-278(14)
Authors: Gorelik, D.; Aloni, S.; Haase, G.

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Adsorption of the formate species on copper surfaces: a DFT study
pp. 279-290(12)
Authors: Gomes, J.R.B.; Gomes, J.A.N.F.

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Relativistic full-potential photoemission for GaAs(110)
pp. 291-296(6)
Authors: Fluchtmann, M.; Bei der Kellen, S.; Braun, J.; Borstel, G.

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Auger photoelectron coincidence spectroscopy of the 2p1/2 line in coincidence with the L3-M45M45 peak of copper
pp. 297-304(8)
Authors: Creagh, C.A.; Thurgate, S.M.; Craig, R.P.; Lund, C.P.

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Substrate-mediated photoinduced chemical reactions on ultrathin metal films
pp. 599-603(5)
Authors: Zhdanov, V.P.; Kasemo, B.

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High-resolution scanning tunneling microscopy imaging of DNA molecules on Cu(111) surfaces
pp. 611-616(6)
Authors: Tanaka, H.; Hamai, C.; Kanno, T.; Kawai, T.

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The Monte Carlo simulation of epitaxial growth of hexagonal GaN
pp. 617-620(4)
Authors: Mao, H.; Lee, S.; Park S.-J.

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Oxygen pressure dependence of the α-Fe2O3(0001) surface structure
pp. 627-634(8)
Authors: Shaikhutdinov, S.K.; Weiss, W.

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