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Publisher: Elsevier

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Volume 394, Number 1, 19 December 1997

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Long-range periodicity in c(8 x 2) benzoate/Cu(110): A combined STM, LEED and HREELS study
pp. 1-25(25)
Authors: Frederick, B.G.; Chen, Q.; Leibsle, F.M.; Lee, M.B.; Kitching, K.J.; Richardson, N.V.

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Electron-stimulated disordering in c(8 x 2) benzoate/Cu(110): A combined STM, LEED and HREELS study
pp. 26-46(21)
Authors: Frederick, B.G.; Chen, Q.; Leibsle, F.M.; Dhesi, S.S.; Richardson, N.V.

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Ab initio calculation of phonons in GaP(110) and InAs(110) and trends within III-V (110) surfaces
pp. 47-59(13)
Authors: Eckl, C.; Fritsch, J.; Pavone, P.; Schroder, U.

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Ag-mediated step-bunching instability on vicinal Si(100)
pp. 60-70(11)
Authors: Folsch, S.; Meyer, G.; Rieder, K.H.; Horn-von Hoegen, M.; Schmidt, T.; Henzler, M.

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Gas-source growth of group IV semiconductors: I. Si(001) nucleation mechanisms
pp. 79-90(12)
Authors: Owen, J.H.G.; Miki, K.; Bowler, D.R.; Goringe, C.M.; Goldfarb, I.; Briggs, G.A.D.

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Gas-source growth of group IV semiconductors: II. Growth regimes and the effect of hydrogen
pp. 91-104(14)
Authors: Owen, J.H.G.; Miki, K.; Bowler, D.R.; Goringe, C.M.; Goldfarb, I.; Briggs, G.A.D.

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Gas-source growth of group IV semiconductors: III. Nucleation and growth of Ge/Si(001)
pp. 105-118(14)
Authors: Goldfarb, I.; Owen, J.H.G.; Hayden, P.T.; Bowler, D.R.; Miki, K.; Briggs, G.A.D.

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Theoretical investigation on the formation process of the stacking-fault triangle in the Si(111)-7 x 7 structure
pp. 119-128(10)
Authors: Hoshino, T.; Kamijou, N.; Fujiwara, H.; Watanabe, T.; Ohdomari, I.

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Structural and spectroscopic investigation of the Yb/Al(001) interface in the submonolayer coverage range
pp. 129-143(15)
Authors: Fasel, R.; Aebi, P.; Schlapbach, L.; Osterwalder, J.

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Reinvestigation of the surface reconstruction of Cu(001)-(2 x 2) p4g-Pd
pp. 131-137(7)
Authors: Shen, Y.G.; Bilic, A.; O'Connor, D.J.; King, B.V.

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Observation of a novel high density 3O(2 x 2) structure on Ru(001)
pp. 138-144(7)
Authors: Widdra, W.; Kostov, K.L.; Gsell, M.; Jakob, P.; Moritz, T.; Menzel, D.

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ESD from LiF thin films
pp. 144-149(6)
Authors: Golek, F.; Markowski, L.

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On the origin of Ne2+ production in low-energy Ne+ scattering from Al and Si surfaces
pp. 145-149(5)
Authors: Xu, F.; Ascione, F.; Manico, G.; Bonanno, A.; Oliva, A.

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Surface reconstruction of the Ir(110) surface
pp. 150-158(9)
Authors: Heiland, W.; Kuntze, J.; Bomermann, J.; Rauch, T.; Speller, S.

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Kikuchi-like effects in X-ray photoelectron diffraction from the CaF2(111) surface
pp. 150-154(5)
Authors: Bardi, U.; Torrini, M.; Ichinoe, Y.; Omori, S.; Ishii, H.; Nihei, Y.; Owari, M.

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Nitride formation and dangling-bond passivation on Si(111)-(7 x 7) with NH3
pp. 155-161(7)
Authors: Bjorkqvist, M.; Karlsson, U.O.; Gothelid, M.

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Real-time STM observations of atomic equilibrium fluctuations in an adsorbate system: O/Ru(0001)
pp. 159-169(11)
Authors: Wintterlin, J.; Trost, J.; Renisch, S.; Schuster, R.; Ertl, G.; Zambelli, T.

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Low-temperature Si(100) etching: Facile abstraction of SiH3(a) by thermal hydrogen atoms
pp. 162-167(6)
Authors: White, J.M.; Gong, B.; Hess, G.; Jo, S.K.; Ekerdt, J.G.

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Formation of isocyanate on Cu(100) from the oxidation of cyanogen and from the decomposition of isocyanic acid
pp. 168-173(6)
Authors: Trenary, M.; Mudalige, K.; Celio, H.; Mills, P.

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Growth and stability of cobalt nanostructures on gold (111)
pp. 170-184(15)
Authors: Tolkes, C.; Zeppenfeld, P.; Krzyzowski, M.A.; David, R.; Comsa, G.

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Long period reconstruction of GaAs(001) surface
pp. 174-178(5)
Authors: Otsuka, N.; Sugawara, A.; Fujieda, K.

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Step-edge barriers: Truths and kinetic consequences
pp. 179-187(9)
Authors: Ehrlich, G.; Kyuno, K.

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Molecular dynamics study of gold adatom diffusion on low-index copper surfaces
pp. 185-191(7)
Authors: Evangelakis, G.A.; Kallinteris, G.C.; Papanicolaou, N.I.

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Model of gas adsorption on magnetic surfaces
pp. 192-200(9)
Authors: Pick, S.; Dreysse, H.

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The growth mechanisms and morphology of C60 films on different substrates
pp. 201-220(20)
Authors: Richter, A.; Ries, R.; Szulzewsky, K.; Pietzak, B.; Smith, R.

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