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Publisher: Elsevier

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Volume 345, Number 3, 20 January 1996

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Absolute composition depth-profiles in surface segregation of PtRh alloys
pp. 29-33(5)
Authors: Florencio, J.; Ren, D.M.; Tsong, T.T.

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Electronic structure of Csgraphite surface studied by Auger-spectroscopy
pp. 44-48(5)
Authors: Khvostov, V.V.; Babaev, V.G.; dementjeva, E.A.; Guseva, M.B.

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Lateral interaction of CO chemisorbed on Ru(0001)
pp. 241-246(6)
Authors: Jacobi, K.; He, P.; Dietrich, H.

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Interface structure of Si(111)-(Ð3 x Ð3)R30o-ErSi2-x
pp. 247-260(14)
Authors: Lohmeier, M.; Huisman, W.J.; Vlieg, E.; Nishiyama, A.; Nicklin, C.L.; Turner, T.S.

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The interaction of Pt with TiO2(110) surfaces: A comparative XPS, UPS, ISS, and ESD study
pp. 261-273(13)
Authors: Schierbaum, K.D.; Fischer, S.; Torquemada, M.C.; de Segovia, J.L.; Roman, E.; Martin-Gago, J.A.

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Formation of the Ce/Y2O3 interface: An in situ XPS study
pp. 290-302(13)
Authors: Thromat, N.; Gautier-Soyer, M.; Bordier, G.

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Composition and structure of the Cu85Pd15(110)-(2 x 1) surface determined by low-energy ion scattering
pp. 303-312(10)
Authors: Brongersma, H.H.; Bergmans, R.H.; van de Grift, M.; van der Gon, A.W.D.

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Structural defects of the Si(111)Ð3 x Ð3-B surface studied by scanning tunneling microscopy
pp. 313-319(7)
Authors: Zotov, A.V.; Kulakov, M.A.; Bullemer, B.; Ryzhkov, S.V.; Saranin, A.A.; Lifshits, V.G.; Eisele, I.

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Detecting stacking faults during epitaxial growth by low energy electron diffraction
pp. 320-330(11)
Authors: de Andres, P.L.; Ascolani, H.; Cerda, J.R.; de Miguel, J.J.; Miranda, R.; Heinz, K.

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On the adsorption site of ethylene at the Ni(110) surface: A combined experimental and theoretical study involving the unoccupied band structure
pp. 331-346(16)
Authors: Rosch, N.; Gutdeutsch, U.; Birkenheuer, U.; Bertel, E.; Cramer, J.; Boettger, J.C.

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Film formation considering the time-dependent concentration of noncondensed molecules
pp. 363-372(10)
Authors: Donner, C.; Baumgartel, H.; Pohlmann, L.

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