Publisher: Elsevier

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Volume 30, Number 2, March 1998

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Measuring the optical parameters of thin films by p-polarized laser beams
pp. 85-89(5)
Authors: Liu, X.; Liang, P.; Zhang, W.; Tang, Y.

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Fibre-optic double-pass confocal microscopy
pp. 91-93(3)
Authors: Gu, M.; Bird, D.

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The precision improvement of the scanner in optical scanning imaging system
pp. 109-112(4)
Authors: Xiang, J.; Wu, Z.; Zhang, P.; Huang, D.; Wei, G.

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Automatic optical activity measurement system
pp. 121-124(4)
Authors: Ribeiro, R.M.; Fiasca, A.B.A.; dos Santos, P.A.M.

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New type of 3.39 m laser beam attenuator
pp. 133-135(3)
Authors: Xu, F.; Jiang, A.

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Infrared optical modulators for missile testing
pp. 137-140(4)
Authors: Richardson, M.A.; Coath, J.A.

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Improvements to laser forming through process control refinements
pp. 141-146(6)
Authors: Thomson, G.; Pridham, M.

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Nonlinear image self-filtering with liquid crystal spatial light modulator
pp. 147-155(9)
Authors: Harada, K.; Itoh, M.; Kotova, S.; Naumov, A.; Parfenov, A.; Yatagai, T.

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