Authors: Kodama S.1; Furumura Y.; Kinoshita K.; Kato H.; Yoda S.
Source: Journal of Crystal Growth, Volume 208, Number 1, 1 January 2000 , pp. 165-170(6)
Publisher: Elsevier
Keywords: [Physical Astronomy Classification Scheme] 81.05.E; [Physical Astronomy Classification Scheme] 81.10.F; Zone melting; InGaAs; Ternary compound semiconductor; Lattice constant; Homogeneity
Language: English
Document Type: Research article
DOI: 10.1016/S0022-0248(99)00413-3
Affiliations: 1: aFujitsu Laboratories Ltd., 10-1 Morinosato-Wakamiya, Atsugi 243-0197, Kanagawa, Japan
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