Efficient test&set constructions for faulty shared memory

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Keywords: Distributed computing; Fault tolerance; Parallel algorithms

Document Type: Research Article

DOI: http://dx.doi.org/10.1016/S0020-0190(97)00036-7

Affiliations: Department of Electrical Engineering, Technion, Haifa 32000, Israel

Publication date: April 14, 1997

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