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Publisher: Elsevier

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Volume 35, Number 2, 1996

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Getting the MES model -- methods for system analysis
pp. 95-103(9)
Authors: Tang, H.; Chen, X.; Luo, Y.; Amirahmadi, H.; Botschek, J.; Ferraz, J.; Jahnel, M.; Skowronek, A.; Weygandt, S.

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Modeling and MIMO controller design of dense powder fluidized beds
pp. 105-119(15)
Authors: Elsabee, M.Z.; Al Sagheer, F.A.; Ali, A.A.M.; Naguib, H.F.; Georghiou, L.; Ventzas, D.E.

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Emerging high speed LANs: a process control perspective
pp. 121-125(5)
Authors: Simionescu, B.C.; Ioan, S.; Grigorescu, G.; Meier, R.L.; Tkacs, D.P.

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Improving management of technological risk: reliability certification of safety systems
pp. 127-136(10)
Authors: Klimova, M.; Szocs, F.; Stavrianidis, P.; Rennie, J.

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Application experiences with Fieldbus instruments
pp. 137-145(9)
Authors: Aminabhavi, T.M.; Phayde, H.T.S.; Ortego, J.D.; Vergnaud, J.M.; Rogers, M.; Tough, A.; Alexander, E.B.; Burt, R.; Schimanski, A.

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Interoperable fieldbus devices: a technical overview
pp. 147-151(5)
Authors: Porzio, W.; Bolognesi, A.; Zhuo, G.; Ezquerra, T.; Boer, M.; del Barrio, G.; Puigdefabregas, J.; Glanzer, D.A.; Cianfrani, C.A.

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The start up of the first five Fieldbus control systems based on the IEC physical layer and on the Fieldbus Foundation specification
pp. 153-158(6)
Authors: Okamoto, A.; Tokita, Y.; Tapio, P.; Sternberg, P.D.; Anderson, M.A.; Graham, R.C.; Beyers, J.L.; Tice, K.R.; Peluso, M.

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The HART(R) protocol an enabler for improved plant performance
pp. 159-164(6)
Authors: Banerjee, A.N.; Das, G.; Giani, L.; Bashan, Y.; Holguin, G.; Strangmann, A.; Helson, R.B.

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Control in the field with HART(R) communications
pp. 165-168(4)
Authors: Vaidya, U.R.; Bhattacharya, M.; Ramkumar, D.; Hakkarainen, M.; Albertsson, A.C.; Karlsson, S.; Liu, Y.; Cobb, J.

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The application of DeviceNet in process control
pp. 169-176(8)
Authors: Lujan, J.L.; Moreno, L.; Burt, R.; Alexander, E.B.; Biegacki, S.; vanGompel, D.

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Fieldbus support for process analysis
pp. 177-183(7)
Authors: Ghosh, P.; Chattopadhyay, B.; Sen, A.K.; Zhang, R.; Jinzhong, Y.; Blevins, T.; Wojsznis, W.

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