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Publisher: Elsevier

Volume 69, Number 12, August 2002

Crack initiation at free edge of interface between thin films in advanced LSI
pp. 1289-1299(11)
Authors: Kitamura, T.; Shibutani, T.; Ueno, T.

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T-stress and its implications for crack growth
pp. 1325-1337(13)
Author: Tong, J.

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Experimental approach to dimple fracture mechanisms under short pulse loading
pp. 1377-1390(14)
Authors: Rizal, S.; Homma, H.; Nazer, M.; Kishida, E.

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Determination of impact fracture toughness of polyethylene using arc-shaped specimens
pp. 1391-1399(9)
Authors: Niglia, J.; Cisilino, A.; Seltzer, R.; Frontini, P.

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