Computation of photoelectron and Auger-electron diffraction III. Evaluation of angle-resolved intensities PAD3
Authors: Chen, X.; Harp, G.R.; Ueda, Y.; Saldin, D.K.
Source: Computer Physics Communications, Volume 112, Number 1, July 1998 , pp. 91-101(11)
Keywords: Angle resolved; Auger; Core-level; Electron diffraction; Electron spectroscopy; Multiple scattering; Photoelectron; Surface structure; [uncontrolled keyword (default)] 61.14.Dc; [uncontrolled keyword (default)] 61.14.Qp; [uncontrolled keyword (default)] 68.35.Bs
Document Type: Research Article
Affiliations: Department of Physics and Laboratory for Surface Studies, University of Wisconsin-Milwaukee, P.O. Box 413, Milwaukee, WI 53201, USA
Publication date: July 1998