Thin wetting films from aqueous electrolyte solutions on SiC/Si wafer

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Keywords: Disjoining pressure; Microinterferometric thickness measurement; Silicon carbide; Thin wetting films

Document Type: Review Article


Affiliations: Department of Physical Chemistry, University of Sofia, Blvd James Bourchier 1, 1126 , Sofia, Bulgaria

Publication date: February 25, 2002

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