Journal of Microscopy

Optimization of EBSD parameters for ultra-fast characterization
pp. 111-118(8)
Authors: CHEN, Y.; HJELEN, J.; GIREESH, S.S.; ROVEN, H.J.

Mechanical properties of asphalt binders evaluated by atomic force microscopy
pp. 119-128(10)
Authors: DOURADO, E.R.; SIMAO, R.A.; LEITE, L.F.M.

Analytical electron microscopy of black carbon and microaggregated mineral matter in Amazonian dark Earth
pp. 129-139(11)
Authors: CHIA, C.H.; MUNROE, P.; JOSEPH, S.D.; LIN, Y.; LEHMANN, J.; MULLER, D.A.; XIN, H.L.; NEVES, E.

Segmentation of virus particle candidates in transmission electron microscopy images
pp. 140-147(8)
Authors: KYLBERG, G.; UPPSTRÖM, M.; HEDLUND, K.-O.; BORGEFORS, G.; SINTORN, I.-M.

Digital correction of motion artefacts in microscopy image sequences collected from living animals using rigid and nonrigid registration
pp. 148-160(13)
Authors: LORENZ, K. S.; SALAMA, P.; DUNN, K. W.; DELP, E. J.

High-resolution cell outline segmentation and tracking from phase-contrast microscopy images
pp. 161-170(10)
Authors: AMBÜHL, M.E.; BREPSANT, C.; MEISTER, J.-J.; VERKHOVSKY, A.B.; SBALZARINI, I.F.

Backscattered electron detection in environmental SEM
pp. 171-185(15)
Author: DANILATOS, G.D.

TEM image analysis and modelling: application to boehmite nanoparticles
pp. 186-199(14)
Authors: MOREAUD, M.; JEULIN, D.; MORARD, V.; REVEL, R.

A pattern recognition method for lattice distortion measurement from HRTEM images
pp. 200-209(10)
Authors: PRZYBYŁA, P.

A 2D MEMS mirror with sidewall electrodes applied for confocal MACROscope imaging
pp. 210-220(11)
Authors: BAI, Y.; PALLAPA, M.; CHEN, A.; CONSTANTINOU, P.; DAMASKINOS, S.; WILSON, B.C.; YEOW, J.T.W.