Journal of Microscopy

Editorial
pp. 1-1(1)
Author: van Hulst, Niek

Diamond colour centres as a nanoscopic light source for scanning near‐field optical microscopy
pp. 2-6(5)
Authors: Kühn, S.; Hettich, C.; Schmitt, C.; Poizat, J-PH.; Sandoghdar, V.

Near-field optical microscopy based on microfabricated probes
pp. 7-11(5)
Authors: Eckert, R.; Freyland, J. M.; Gersen, H.; Heinzelmann, H.; Schürmann, G.; Noell, W.; Staufer, U.; De Rooij, N. F.

Microfabricated silicon dioxide cantilever with subwavelength aperture
pp. 12-15(4)
Authors: Mitsuoka, Y.; Niwa, T.; Ichihara, S.; Kato, K.; Muramatsu, H.; Nakajima, K.; Shikida, M.; Sato, K.

Moulded photoplastic probes for near-field optical applications
pp. 16-21(6)
Authors: Kim, B. J.; Flamma, J. W.; Ten Have, E. S.; Garcia-Parajo, M. F.; Van Hulst, N. F.; Brugger, J.

High-resolution constant-height imaging with apertured silicon cantilever probes
pp. 22-27(6)
Authors: Dziomba, T.; Danzebrink, H. U.; Lehrer, C.; Frey, L.; Sulzbach, T.; Ohlsson, O.

Spatial distribution and polarization dependence of the optical near-field in a silicon microfabricated probe
pp. 28-33(6)
Authors: Minh, P. N.; Ono, T.; Tanaka, S.; Esashi, M.

Silicon technology-based micro-systems for atomic force microscopy/photon scanning tunnelling microscopy
pp. 34-38(5)
Authors: Gall-Borrut, P.; Belier, B.; Falgayrettes, P.; Castagne, M.; Bergaud, C.; Temple-Boyer, P.

Transmission line probe based on a bow-tie antenna
pp. 39-44(6)
Authors: Oesterschulze, E.; Georgiev, G.; Müller-Wiegand, M.; Vollkopf, A.; Rudow, O.

Shaping the reflection near‐field optical probe: finite domain time difference modelling and fabrication using a focused ion beam
pp. 45-49(5)
Authors: Spajer, M.; Parent, G.; Bainier, C.; Charraut, D.

Design and optimization of tapered structure of near-field fibre probe based on finite-difference time-domain simulation
pp. 50-52(3)
Authors: Nakamura, H.; Sato, T.; Kambe, H.; Sawada, K.; Saiki, T.

SNOM/STM using a tetrahedral tip and a sensitive current-to-voltage converter
pp. 53-59(7)
Authors: Heimel, J.; Fischer, U. C.; Fuchs, H.

Non-regularly shaped plasmon resonant nanoparticle as localized light source for near-field microscopy
pp. 60-65(6)
Authors: Kottmann, J. P.; Martin, O. J. F.; Smith, D. R.; Schultz, S.

The role of tip plasmons in near-field Raman microscopy
pp. 66-71(6)
Authors: Milner, R. G.; Richards, D.

A single gold particle as a probe for apertureless scanning near-field optical microscopy
pp. 72-76(5)
Authors: Kalkbrenner, T.; Ramstein, M.; Mlynek, J.; Sandoghdar, V.

Pure optical contrast in scattering-type scanning near‐field microscopy
pp. 77-83(7)
Authors: HillenbRand, R.; Knoll, B.; Keilmann, F.

Optical near-field harmonic demodulation in apertureless microscopy
pp. 84-93(10)
Authors: Maghelli, N.; Labardi, M.; Patanè, S.; Irrera, F.; Allegrini, M.

Apertureless near-field optical microscopy via local second-harmonic generation
pp. 94-99(6)
Authors: Zayats, A. V.; Sandoghdar, V.

Photocatalytic deposition of a gold nanoparticle onto the top of a SiN cantilever tip
pp. 100-103(4)
Authors: Okamoto, T.; Yamaguchi, I.

Local phase measurements of light in a one-dimensional photonic crystal
pp. 104-109(6)
Authors: Flück, E.; Otter, A. M.; Korterik, J. P.; Balistreri, M. L. M.; Kuipers, L.; Van Hulst, N. F.

Near-field optical probing of two-dimensional photonic crystals: theory and experiment
pp. 110-116(7)
Authors: Mulin, D.; Girard, C.; Colas Des Francs, G.; Spajer, M.; Courjon, D.

Mapping and manipulating whispering gallery modes of a microsphere resonator with a near-field probe
pp. 117-121(5)
Authors: Götzinger, S.; Demmerer, S.; Benson, O.; Sandoghdar, V.

Light field propagation by metal micro- and nanostructures
pp. 122-128(7)
Authors: Krenn, J. R.; Salerno, M.; Felidj, N.; Lamprecht, B.; Schider, G.; Leitner, A.; Aussenegg, F. R.; Weeber, J. C.; Dereux, A.; Goudonnet, J. P.

Local field enhancement effects for nanostructuring of surfaces
pp. 129-135(7)
Authors: Münzer, H.-J.; Mosbacher, M.; Bertsch, M.; Zimmermann, J.; Leiderer, P.; Boneberg, J.

Experimental statistics of near-field intensity distributions at nanostructured surfaces
pp. 136-141(6)
Authors: Coello, V.; Bozhevolnyi, S. I.

Fundamental differences between micro- and nano-Raman spectroscopy
pp. 142-147(6)
Authors: Ayars, E. J.; Jahncke, C. L.; Paesler, M. A.; Hallen, H. D.

The correlation between polarization modulated near‐field optical images and the anisotropy of the probe
pp. 148-153(6)
Authors: Wei, P. K.; Fann, W. S.

Non-optical tip-sample distance control method for scanning near-field optical microscopy using a piezoresistive micro cantilever
pp. 154-161(8)
Authors: Muramatsu, H.; Egawa, A.; Homma, K.; Kim, J.-M.; Takahashi, H.; Shirakawabe, Y.; Shimizu, N.

Non-optically probing near-field microscopy with illumination of total internal reflection
pp. 162-171(10)
Authors: Kitano, H.; Murakami, M.; Kawata, Y.; Egami, C.; Sugihara, O.; Okamoto, N.; Tsuchimori, M.; Watanabe, O.

Tapping-mode tuning-fork near-field scanning optical microscopy of low power semiconductor lasers
pp. 172-175(4)
Authors: Lu, N. H.; Lin, W. C.; Tsai, D. P.

Separating different contributions to the shear force in near-field microscopy
pp. 176-181(6)
Authors: Leuschner, M.; Schüttler, M.; Giessen, H.

Well-shaped fibre tips by pulling with a foil heater
pp. 182-187(6)
Authors: Gallacchi, R.; Kölsch, S.; Kneppe, H.; Meixner, A. J.

Photoconductive imaging in a photon scanning tunnelling microscope capable of point-contact current sensing using a conductive fibre probe
pp. 188-192(5)
Authors: Iwata, F.; Someya, D.; Sakaguchi, H.; Igasaki, Y.; Kitao, M.; Kubo, T.; Sasaki, A.

Low temperature near-field luminescence studies of localized and delocalized excitons in quantum wires
pp. 193-201(9)
Authors: Intonti, F.; Emiliani, V.; Lienau, C.; Elsaesser, T.; Nötzel, R.; Ploog, K. H.

Low-temperature near-field spectroscopy of CdTe quantum dots
pp. 202-208(7)
Authors: Brun, M.; Huant, S.; Woehl, J. C.; Motte, J.-F.; Marsal, L.; Mariette, H.

Near-field spectroscopy of single quantum dots at room temperature
pp. 209-211(3)
Authors: Ikeda, K.; Matsuda, K.; Saito, H.; Nishi, K.; Saiki, T.

Photoluminescence properties of multiple stacked planes of GaN/AlN quantum dots studied by near-field optical microscopy
pp. 212-217(6)
Authors: Gucciardi, P. G.; Vinattieri, A.; Colocci, M.; Damilano, B.; Grandjean, N.; Semond, F.; Massies, J.

Autocorrelation spectroscopy on single ultrathin layers of CdSe/ZnSe: hints for a non-thermal distribution of excitons in quantum islands
pp. 218-222(5)
Authors: Von Freymann, G.; Kurtz, E.; Klingshirn, C.; Litvinov, D.; Gerthsen, D.; Schimmel, T. H.; Wegener, M.

Near-field optics on silicon-electrolyte junctions
pp. 223-228(6)
Authors: Diesinger, H.; Bsiesy, A.; Hérino, R.; Huant, S.

Femtosecond near-field spectroscopy: carrier relaxation and transport in single quantum wires
pp. 229-240(12)
Authors: Emiliani, V.; Guenther, T.; Lienau, C.; Nötzel, R.; Ploog, K. H.

Femtosecond near-field scanning optical microscopy study of molecular thin films
pp. 241-243(3)
Authors: Kawashima, H.; Furuki, M.; Tatsuura, S.; Tian, M.; Sato, Y.; Pu, L. S.; Tani, T.

Near- and far-field second-harmonic imaging of quasi-phase-matching crystals
pp. 244-249(6)
Authors: Vohnsen, B.; Bozhevolnyi, S. I.

Near-field second harmonic imaging of the c/a/c/a polydomain structure of epitaxial PbZr_xTi_1-xO₃ thin films
pp. 250-254(5)
Authors: Smolyaninov, I. I.; Liang, H. Y.; Lee, C. H.; Davis, C. C.; Nagarajan, V.; Ramesh, R.

State-selective optical near-field resonant ionization spectroscopy of atoms near a dielectric surface
pp. 255-260(6)
Authors: Ohdaira, Y.; Kijima, K.; Terasawa, K.; Kawai, M.; Hori, H.; Kitahara, K.