A method for characterizing longitudinal chromatic aberration of microscope objectives using a confocal optical system

Authors: Juškaitis; Wilson

Source: Journal of Microscopy, Volume 195, Number 1, 1 July 1999 , pp. 17-22(6)

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Abstract:

We describe a novel method of characterizing the longitudinal chromatic aberration of microscope objectives by recording a series of axial responses as a function of wavelength as a plane reflector is scanned through the focal region of a confocal microscope. Measurements are presented for a variety of objectives with differing degrees of correction. The use of the chromatic focal shift to measure surface profiles is also discussed.

Keywords: Confocal microscopy; chromatic aberration

Document Type: Research article

DOI: http://dx.doi.org/10.1046/j.1365-2818.1999.00488.x

Affiliations: 1: Department of Engineering Science, University of Oxford, Parks Road, Oxford OX1 3PJ, U.K.

Publication date: 1999-07-01