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Publisher: Wiley-Blackwell

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Volume 47, Number 3, Fall 2010

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A New Approach to Comparing Several Equating Methods in the Context of the NEAT Design
pp. 261-285(25)
Authors: Sinharay, Sandip; Holland, Paul W.

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Comparisons among Small Sample Equating Methods in a Common-Item Design
pp. 286-298(13)
Authors: Kim, Sooyeon; Livingston, Samuel A.

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Hierarchical Logistic Regression: Accounting for Multilevel Data in DIF Detection
pp. 299-317(19)
Authors: French, Brian F.; Finch, W. Holmes

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A Comparison of Item Fit Statistics for Mixed IRT Models
pp. 318-338(21)
Authors: Chon, Kyong Hee; Lee, Won-Chan; Dunbar, Stephen B.

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The Gain-Loss Model: A Probabilistic Skill Multimap Model for Assessing Learning Processes
pp. 373-394(22)
Authors: Robusto, Egidio; Stefanutti, Luca; Anselmi, Pasquale

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