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Journal of Educational Measurement logo

Publisher: Wiley-Blackwell

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Volume 46, Number 3, Fall 2009

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Conceptual Issues in Response-Time Modeling
pp. 247-272(26)
Author: van der Linden, Wim J.

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Automated Test Assembly for Cognitive Diagnosis Models Using a Genetic Algorithm
pp. 273-292(20)
Authors: Finkelman, Matthew; Kim, Wonsuk; Roussos, Louis A.

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Reliability and Attribute-Based Scoring in Cognitive Diagnostic Assessment
pp. 293-313(21)
Authors: Gierl, Mark J.; Cui, Ying; Zhou, Jiawen

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The Circle-Arc Method for Equating in Small Samples
pp. 330-343(14)
Authors: Livingston, Samuel A.; Kim, Sooyeon

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Small-Sample Equating Using a Single-Group Nearly Equivalent Test (SiGNET) Design
pp. 344-362(19)
Authors: Puhan, Gautam; Moses, Timothy P.; Grant, Mary C.; McHale, Frederick

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