Journal of Educational Measurement

A Further Look at the Correlation Between Item Parameters and Item Fit Statistics
pp. 1-15(15)
Authors: Sinharay, Sandip; Lu, Ying

An Approach to Evaluating the Missing Data Assumptions of the Chain and Post-stratification Equating Methods for the NEAT Design
pp. 17-43(27)
Authors: Holland, Paul W.; Sinharay, Sandip; von Davier, Alina A.; Han, Ning

Modeling Judgments in the Angoff and Contrasting-Groups Method of Standard Setting
pp. 45-63(19)
Authors: Van Nijlen, Daniël; Janssen, Rianne

Using the Attribute Hierarchy Method to Identify and Interpret Cognitive Skills that Produce Group Differences
pp. 65-89(25)
Authors: Gierl, Mark J.; Zheng, Yinggan; Cui, Ying

Measuring the mind: Conceptual issues in contemporary psychometrics, by Borsboom, D.
pp. 91-94(4)
Author: Leighton, Jacqueline P.

Data analysis using regression and multilevel/hierarchical models, by Gelman, A., & Hill, J.
pp. 94-97(4)
Author: Vaughn, Brandon K.